le79234-sw Zarlink Semiconductor, le79234-sw Datasheet
le79234-sw
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le79234-sw Summary of contents
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... Each software package has an associated hardware configuration. Detailed reference designs are available for each configuration. 1 Zarlink Semiconductor Inc. ™ Le79234-SW Data Sheet Version 1 July 2009 Description Call Control Basic Test Advanced Test ...
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... VoicePath™ API-II Test Library User’s Guide • 081567 Le79124 NGVCP Data Sheet • 133514 Le79234 NGVCP Data Sheet • 081193 Le79238 Octal NGSLAC Data Sheet • 081555 Le79271 NGSLIC Data Sheet • 126583 NGCC Hardware Design Guide Le79234-SW 2 Zarlink Semiconductor Inc. Data Sheet ...
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... Configuration D Topology (VP_TERM_FXS_TI 1.10 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 2.0 Line Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.1 Time Slot Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.2 Device Level Test Restrictions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.3 Line Test Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.4 Measurement Range and Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 2.5 Calibration Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 2.6 Test Timing Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 2.7 Termination and Signature Network Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.0 Memory Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 Le79234-SW Table of Contents 3 Zarlink Semiconductor Inc. Data Sheet ...
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... Figure 1 - NGCC System Architecture with Le79234 NGVCP Figure 2 - Configuration C Topology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Figure 3 - Configuration D Topology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Figure 4 - Calibration Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Figure 5 - M-Socket Termination . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Figure 6 - PPA Termination . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Figure Signature Network . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Figure 8 - CPE Splitter Signature Network Figure Splitter Signature Networks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 Le79234-SW List of Figures 4 Zarlink Semiconductor Inc. Data Sheet ...
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... Table 8 - GR-909 Tests and their corresponding Test Library Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Table 9 - Configuration C Measurement Range and Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Table 10 - Configuration D Measurement Range and Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 11 - Calibration Circuit Parts List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 Table 12 - Test Timing Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 Table 13 - Approximate Memory Requirements per VCP Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 Le79234-SW List of Tables 5 Zarlink Semiconductor Inc. Data Sheet ...
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... NGVCP feature may be used. Example of initialization features include: • Boot-load the firmware image into the NGVCP and start the DSP core inside the NGVCP. • Configure all lines with specified design parameters. • Calibrate all analog circuits of termination devices. Le79234-SW 6 Zarlink Semiconductor Inc. Data Sheet ...
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... The software package controls the NGVCP device. The NGVCP device’s registers and commands are shielded behind the VP-API-II which is the communication layer between the NGVCP device and the customer’s host processor. The NGVCP firmware is currently available in four variations, depending on the test package selected: Le79234-SW 7 Zarlink Semiconductor Inc. Data Sheet ...
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... Then, the application can either load the profiles into the NGVCP, keep the profiles on the host and download them on demand, or perform a combination of the two methods. The VoicePath™ Profile Wizard and WinSLAC are Microsoft NGCC Design Kit and are used to create the various profiles needed to fulfill the specific market requirements. Le79234-SW ® ® Windows ...
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... Control Engine ( Lines) -Caller ID (CID) -Call Control -GR-909 Testing -Advanced Line Testing Le79234 NGVCP Figure 1 - NGCC System Architecture with Le79234 NGVCP Le79234-SW Host Customer Applications VoicePath Test Library (VP-TL ) System Services (Software Interface Layer) - Test Bus relay VP-API-II (Application ...
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... The physical layer defines the electrical characteristics of the interface (pins, timings, etc.) between the host and the NGVCP. The NGVCP supports two different physical layers: a General Purpose Parallel Interface (GPI) and a Serial Peripheral Interface (SPI). This layered architecture allows the host programmer to program the NGVCP independent of the chosen physical layer. Le79234-SW 10 Zarlink Semiconductor Inc. Data Sheet ...
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... VoicePath™ Test Library software. The VoicePath™ software for NGCC currently supports two general hardware topologies. Table 2 Hardware Software Termination Topologies Types Configuration C VP_TERM_FXS_GENERIC Configuration D VP_TERM_FXS_TI Table 2 - VoicePath™ Test Library Supported Termination Types Le79234-SW Table 1. There are 32 channels for the Le79234 device, Chip Select GPIO SLAC_I TQFP Pin D GPIO # 0 CS0 ...
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... VBH BD BD RSVB NGSLAC SVB Configuration C supports the relay states listed in for the various relay states is listed in Software State (VpRelayState) VP_RELAY_NORMAL VP_RELAY_TALK VP_RELAY_BRIDGED_TEST Table 3 - Software States for Configuration C Le79234-SW R PTC or LOAD (optional) Resistor Over-Voltage Protection PTC or Resistor Figure 2 - Configuration C Topology Table 3 ...
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... Self-test is performed using the calibration circuit or a per-channel test load resistor. RSVA NGSLAC SVA AD AD Le79271 NGSLIC TLD VBP VBH BD BD RSVB NGSLAC SVB Le79234-SW AD/BD SVA/SVB Calibration Bus R PTC or LOAD (optional) Resistor Over-Voltage Protection PTC or Resistor Calibration Bus Figure 3 - Configuration D Topology 13 Zarlink Semiconductor Inc ...
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... Configuration C does not include a relay and can only be calibrated at the Factory by applying the calibration circuit directly to the line A and B leads. Configuration D has a relay that can provide Calibration Bus access to perform In-Service Calibration. Of course the Factory Calibration can also be performed with Configuration D. Le79234-SW Table 5. See the API-II Reference Guide for details. Table 6 ...
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... Many of these tests will be used for GR-844 testing. A subset of these will be used for GR-909 testing. These tests are detailed in Table 8. Le79234-SW 15 Zarlink Semiconductor Inc. Data Sheet ...
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... To measure the resistances connected between Tip and Ground, Ring and Ground, and Tip to Ring as well as Five-Element Insulation resistances between Tip and Battery and Ring and Resistance Test battery. Table 7 - NGVCP-NGCC Supported Line Test Packages Le79234-SW Description VP-Test Library Names VPTL_TID_CALIBRATE VPTL_TID_APPLY_CALIBRATION VPTL_TID_OPEN_DC_VOLTAGE VPTL_TID_OPEN_AC_VOLTAGE ...
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... To measure the AC current flowing in each lead when the Foreign AC Currents Test line is set to a specific common mode voltage. Table 7 - NGVCP-NGCC Supported Line Test Packages (continued) Le79234-SW Description VP-Test Library Names VPTL_TID_6ELE_RES VPTL_TID_MSOCKET VPTL_TID_CO_SPLITTER Figure 9 ...
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... To measure the ringing voltage while applying normal Ringing Monitor Test ringing on a terminating call. Table 7 - NGVCP-NGCC Supported Line Test Packages (continued) Le79234-SW Description VP-Test Library Names VPTL_TID_REN VPTL_TID_REN_PHASE VPTL_TID_DTMF_PULSE_MSRMNT ...
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... The published Self Test accuracies are given for production testing only when no loop is connected to the equipment port. If the Self Tests are performed in the field, the host application needs to interpret the data accordingly, taking into account any loop impedance present. Table 7 - NGVCP-NGCC Supported Line Test Packages (continued) Le79234-SW Description VP-Test Library Names ...
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... To measure the sum of the line circuit noise and the subscriber loop noise Idle channel noise using a C-Message filter Table 8 - GR-909 Tests and their corresponding Test Library Names Notes: 1. Requires the test load resistor as the termination. 2. Using open-circuit as the reflect termination. Le79234-SW Description VPTL_TID_OPEN_AC_VOLTAGE VPTL_TID_OPEN_DC_VOLTAGE VPTL_TID_3ELE_RES VPTL_TID_ROH VPTL_TID_REN VPTL_TID_GR909_ALL VPTL_TID_DC_FEED_SELF_TEST and ...
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... NGCC Hardware Design Guide, Document ID 126583. Refer to the notes following the tables for additional information. Test Library Function Specific Test VPTL_TID_OPEN_DC_VOLTAGE Tip or ring voltage Tip or ring voltage VPTL_TID_OPEN_AC_VOLTAGE Differential voltage Le79234-SW CONFIGURATION C No Calibration RSVA/RSVB 0.5%, 100 ppm Parameter From To -1000 -400 ...
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... Test Library Function Specific Test VPTL_TID_MONITOR_IV DC current Test with offset VPTL_TID_DC_LOOP_RES compensation Mechanical ringer test VPTL_TID_REN Electronic ringer test Table 9 - Configuration C Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION C No Calibration RSVA/RSVB 0.5%, 100 ppm Parameter From To Unit Notes 3, 8, 13, 14 ...
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... Test Library Function Specific Test Resistance to GND VPTL_TID_3ELE_RES, VPTL_TID_4ELE_RES Resistance Table 9 - Configuration C Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION C No Calibration RSVA/RSVB 0.5%, 100 ppm Parameter From To Unit Ω 1 1000 ±3.0% & ±5 Ω 100 kΩ Notes 100 ...
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... Test Library Function Specific Test VPTL_TID_3ELE_RES Foreign DC currents Capacitance to GND VPTL_TID_3ELE_CAP Capacitance VPTL_TID_FOREIGN_ AC_CURRENT Table 9 - Configuration C Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION C No Calibration RSVA/RSVB 0.5%, 100 ppm Parameter From To Unit IAE + IBE (Notes mArm AC current rejection 0 40 ...
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... Test Library Function Specific Test Dial pulse test VPTL_TID_DTMF_PULSE_ MSRMNT DTMF test VPTL_TID_NOISE VPTL_TID_SNR_QNTZ_DIST VPTL_TID_ARB_TONE VPTL_TID_AC_TRANS VPTL_TID_TONE_GEN VPTL_TID_UNBAL_TONE Notes 19, 24 Table 9 - Configuration C Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION C No Calibration RSVA/RSVB 0.5%, 100 ppm Parameter From To Unit Dial Speed 8 12 pps Break Interval 40 ...
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... LOSS Table 9 - Configuration C Measurement Range and Accuracy (continued) Test Library Specific Parameter Function Test Notes 10, 12, 13 VPTL_TID_OPEN_ Tip or ring voltage DC_VOLTAGE AC induction rejection Le79234-SW CONFIGURATION C No Calibration RSVA/RSVB 0.5%, 100 ppm Parameter From To Unit -40 0 dBm Notes 300 800 Hz ...
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... VPTL_TID_ Notes 3, 8, 13, DC current 14, 15 MONITOR_IV Test with Notes VPTL_TID_DC_ offset compensa- LOOP_RES Note 4 tion Table 10 - Configuration D Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION D No Calibration RSVA/RSVB 0.5%, 100 ppm No Calibration Bus From To Unit Accuracy From 0 280 ±1.85% & ±0. ...
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... VPTL_TID_REN Range With 500 Ω to 7500 Ω series Electronic resistor and ringer test > 100 kΩ parallel resistor Table 10 - Configuration D Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION D No Calibration RSVA/RSVB 0.5%, 100 ppm No Calibration Bus From To Unit Accuracy From ±5% & ±10 Ω ...
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... Function Test Resistance Notes GND VPTL_TID_ 3ELE_RES, VPTL_TID_ 4ELE_RES Resistance A Notes Table 10 - Configuration D Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION D No Calibration RSVA/RSVB 0.5%, 100 ppm No Calibration Bus From To Unit Accuracy From Ω ±3.25% & ±7.5 Ω 1 1000 1 ± ...
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... AC current rejection Capacitance Notes GND VPTL_TID_ 3ELE_CAP Notes Capacitance Signal Freq. Range Table 10 - Configuration D Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION D No Calibration RSVA/RSVB 0.5%, 100 ppm No Calibration Bus From To Unit Accuracy From Ω ±3.25% & ±7.5 Ω 1 ...
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... DTMF_PULSE_ DTMF Level MSRMNT (Notes 6, 8) DTMF test DTMF Level (Notes 6, 8) VPTL_TID_NOISE Notes VPTL_TID_ Notes SNR_QNTZ_DIST Table 10 - Configuration D Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION D No Calibration RSVA/RSVB 0.5%, 100 ppm No Calibration Bus From To Unit Accuracy From mA 0.1 40 ±5% ...
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... UNBAL_TONE DC level output Self Test Notes VPTL_TID_ DRAW_BREAK_ DIALTONE Inward test Notes 6, 8 VPTL_TID_TRANS_ Notes HYBRID_LOSS Table 10 - Configuration D Measurement Range and Accuracy (continued) Le79234-SW CONFIGURATION D No Calibration RSVA/RSVB 0.5%, 100 ppm No Calibration Bus From To Unit Accuracy From -40 0 dBm ±0.5 dB ...
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... Service calibration factors (if applicable), and running the test. 12. Accuracy of VPTL_TID_INWRD_CUR is set by this test. 13. Accuracy of DC voltage level when using VPTL_TID_MONITOR_IV is set by VPTL_TID_OPEN_DC_VOLTAGE. 14. Accuracy of AC voltage level when using VPTL_TID_MONITOR_IV is set by VPTL_TID_OPEN_AC_VOLTAGE. 15. Accuracy of AC current level when using VPTL_TID_MONITOR_IV is set by VPTL_TID_FOREIGN_AC_CURRENT. Le79234-SW 33 Zarlink Semiconductor Inc. Data Sheet ...
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... This is equivalent to a 11.7 Vpeak sinewave at 3400 Hz. DCA DCB 2.5 Calibration Circuit The calibration circuit used for In-Service Calibration is shown in The Test-In Bus leads are wired to the Calibration Bus leads of Configuration D shown in The bill of materials for the calibration circuit is listed in Le79234- -1.6% + 100 -1.3% + ...
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... TEST-IN BUS 50PPM 50PPM TIP/RING SW LOAD/CAL SW 3 KC3A KC3A KC1B KC1B TTESTIN 2 7 RTESTIN CAL/SHORT SW AGN200A03H AGN200A03H AGN200A03H AGN200A03H Le79234- CALIBRATION CIRCUIT VBATH R1 R1 6.8K 6. 13.0K 13. AGND KC2A KC2A 383K 383K 0.25% 4 0.333 Watt ...
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... Zener Diode 1SMA5941 D2, D3, D4 Diode BAS116T KC1C, KC2C, DPDT Relay AGN200A03 KC3C Table 11 - Calibration Circuit Parts List Note: Listed part numbers may have a tighter tolerance then required. Le79234-SW Required Manufacturer Value Tolerance Rating National ±0.2% Semiconductor Max National offset Semiconductor ±3 mV Diodes Inc ...
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... High cap 12 μF and induction VPTL_TID_DISTANCE_TO_OPEN VPTL_TID_FUSE_TEST - Ringer present (phone on-hook) - Open circuit (no phone present) VPTL_TID_NOISE - FILTER_15KHZ - Others VPTL_TID_TRANS_HYBRID_LOSS VPTL_TID_SNR_QNTZ_DIST VPTL_TID_RD_LOOP_BAT_COND_TEST VPTL_TID_DC_FEED_SELF_TEST Le79234-SW Table 12 - Test Timing Analysis 37 Zarlink Semiconductor Inc. Data Sheet Test Execution Time in mS Configuration C Configuration D TBD TBD TBD TBD ...
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... All tests executed - Foreign voltage present VPTL_TID_TONE_GEN - Duration VPTL_TID_HOWLER_TEST Table 12 - Test Timing Analysis (continued) Note: * Delay is the dial tone application delay. This delay is dependent upon the host platform. Le79234-SW Test Execution Time in mS Configuration C 38 Zarlink Semiconductor Inc. Data Sheet Configuration D TBD ...
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... Termination and Signature Network Diagrams A lead (Tip) B lead (Ring) Le79234-SW 400 V Ringer 470 Kohm 1.8 uF Telephone M-Socket Figure 5 - M-Socket Termination B lead (Tip) Diode 470 Kohm PT A lead (Ring) Figure 6 - PPA Termination 39 Zarlink Semiconductor Inc. Data Sheet ...
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... Le79234-SW B lead (Ring 0.47 uF SIG SIG Kohm R SIG A lead (Tip) Figure 7 - IAD Signature Network B lead (Ring 0.47 uF SIG SIG Kohm R SIG A lead (Tip) TI.413 G.992.1 TR 101 728 ATIS-0600016.2008 Figure 8 - CPE Splitter Signature Network 40 Zarlink Semiconductor Inc. ...
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... A lead (Tip) (Tip) Diode = 0 110 Kohm R SIG B lead B lead (Ring) (Ring) G.992.1 TR 101 728 Figure Splitter Signature Networks Le79234-SW A lead (Tip) Diode = 0 Kohm R SIG B lead (Ring) T1.413 G.992.1 cor 1 G.992.3 TRQ10-2003 41 Zarlink Semiconductor Inc. ...
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... C standard data types: float = 4 bytes int = 4 bytes char = 1 byte bool = 1 byte And the API defined variable types: int16; uint16 = 2 bytes int32; uint32 = 4 bytes int8; uint8, uchar = 1 byte Le79234-SW Per VCP Device (Bytes) 77000 788 50 40 120 41 31 ...
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... Le79234-SW 43 Zarlink Semiconductor Inc. Data Sheet ...
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... Zarlink, ZL, the Zarlink Semiconductor logo and the Legerity logo and combinations thereof, VoiceEdge, VoicePort, SLAC, ISLIC, ISLAC and VoicePath are trademarks of Zarlink Semiconductor Inc. TECHNICAL DOCUMENTATION - NOT FOR RESALE Le79234-SW visit our Web Site at www.zarlink.com C Patent rights to use these components ...