hcts14dmsr Intersil Corporation, hcts14dmsr Datasheet

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hcts14dmsr

Manufacturer Part Number
hcts14dmsr
Description
Radiation Hardened Hex Inverting Schmitt Trigger
Manufacturer
Intersil Corporation
Datasheet
August 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Cosmic Ray Upset Rate 2 x 10
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
• Input Current Levels Ii
Description
The Intersil HCTS14MS is a Radiation Hardened HEX Inverting
Schmitt trigger. A high on any input forces the output to a Low
state.
The HCTS14MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCTS14MS is supplied in a 14 lead Ceramic flatpack
Package (K suffix) or a 14 lead SBDIP Package (D suffix).
Ordering Information
HCTS14DMSR
HCTS14KMSR
HCTS14D/
Sample
HCTS14K/
Sample
HCTS14HMSR
(Typ)
- VIL = 0.8V Max
- VIH = VCC/2 Min
NUMBER
PART
TEMPERATURE
-55
-55
o
o
RANGE
C to +125
C to +125
+25
+25
+25
10
o
o
o
C
C
C
RAD (Si)/s 20ns Pulse
5 A at VOL, VOH
|
o
o
Copyright
C
C
-9
Intersil Class
S Equivalent
Intersil Class
S Equivalent
Sample
Sample
Die
SCREENING
12
o
Errors/Bit Day
C to +125
LEVEL
©
RAD (Si)/s
Intersil Corporation 1999
o
-9
C
2
14 Lead SBDIP
14 Lead Ceramic
Flatpack
14 Lead SBDIP
14 Lead Ceramic
Flatpack
Die
/mg
Errors/Bit-Day
PACKAGE
390
Pinouts
Functional Diagram
HCTS14MS
GND
A1
A2
A3
Y1
Y2
Y3
An
HEX Inverting Schmitt Trigger
NOTE: L = Logic Level Low,
FLATPACK PACKAGE (FLATPACK)
14 LEAD CERAMIC DUAL-IN-LINE
14 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
GND
INPUTS
H = Logic level High
MIL-STD-1835 CDFP3-F14
A1
Y1
A2
Y2
A3
Y3
MIL-STD-1835 CDIP2-T14
An
H
L
1
2
3
4
5
6
7
TRUTH TABLE
1
2
3
4
5
6
7
TOP VIEW
TOP VIEW
Radiation Hardened
Spec Number
14
13
12
11
10
9
8
OUTPUTS
File Number
14
13
12
11
10
9
8
Yn
H
VCC
A6
Y6
A5
Y5
A4
Y4
L
518607
3205.1
Yn
VCC
A6
Y6
A5
Y5
A4
Y4

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hcts14dmsr Summary of contents

Page 1

... This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. The HCTS14MS is supplied lead Ceramic flatpack Package (K suffi lead SBDIP Package (D suffix). Ordering Information PART TEMPERATURE SCREENING NUMBER RANGE o o HCTS14DMSR - +125 C Intersil Class S Equivalent o o HCTS14KMSR - +125 C ...

Page 2

Absolute Maximum Ratings Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V Input Voltage ...

Page 3

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Propagation Delay TPHL VCC = 4.5V, VIH = 3.0V, VIL = 0V TPLH VCC = 4.5V, VIH = 3.0V, VIL = 0V Input Switch Point VT+ VCC = 4.5V VT- VCC = ...

Page 4

TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) PARAMETER SYMBOL Output Voltage High VOH Input Leakage Current IIN Noise Immunity Functional Test FN Propagation Delay TPHL TPLH Input Switch Points VT+ VT- VH NOTES: 1. All voltages referenced to ...

Page 5

CONFORMANCE GROUPS METHOD Group E Subgroup 2 5005 NOTE: 1. Except FN test which will be performed 100% Go/No-Go. TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS OPEN GROUND STATIC BURN-IN I TEST CONDITIONS (Note ...

Page 6

Intersil Space Level Product Flow - ‘MS’ Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method ...

Page 7

... All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use ...

Page 8

Die Characteristics DIE DIMENSIONS mils 2,20 x 2.24mm METALLIZATION: Type: AlSi Å Å Metal Thickness: 11k 1k GLASSIVATION: Type: SiO 2 Å Å Thickness: 13k 2.6k WORST CASE CURRENT DENSITY <2 A/cm BOND ...

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