IRG4BC40FD

Manufacturer Part NumberIRG4BC40FD
DescriptionFit Rate / Equivalent Device Hours
ManufacturerIRF [International Rectifier]
IRG4BC40FD datasheet
 


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Quarterly Reliability Report
for
T0247 / T0220 Products Manufactured at
IRGB
IGBT / CoPack
ISSUE.3.
October 1997
IGBT / CoPack
Page 1 of 35
Quarterly Reliability Report

IRG4BC40FD Summary of contents

  • Page 1

    Quarterly Reliability Report T0247 / T0220 Products Manufactured at IGBT / CoPack Quarterly Reliability Report for IRGB IGBT / CoPack ISSUE.3. October 1997 Page ...

  • Page 2

    Introduction 2 Reliability Information 3 Environmental Test Results 4 Environmental Test Conditions / Schematics 5 Device Package and Frequency Listings IGBT / CoPack Quarterly Reliability Report Contents Page ...

  • Page 3

    The reliability report is a summary of the test data collated since the implementation of the reliability programme. This report will be periodically updated typically on a quarterly basis. Future publications of this report will also include as appropriate additional ...

  • Page 4

    IGBT / CoPack Quarterly Reliability Report Section 2 Reliability Information Page ...

  • Page 5

    Fit Rate / Equivalent Device Hours Traditionally, reliability results have been presented in terms of Mean-Time-To-Failure or Median-Time-To-Failure. While these results have their value, they do not necessarily tell the designer what he most needs to know. For example, the ...

  • Page 6

    Using IGBT Reliability Information Reliability is the probability that a semiconductor device will perform its specified function in a given environment for a specified period of time. Reliability is quality over time & environmental conditions. Reliability can be defined as ...

  • Page 7

    The silicon cross-section of an Insulated Gate Bipolar Transistor (IGBT), the terminal called Collector is, actually, the Emitter of the PNP. In spite of its similarity to the cross-section of a power MOSFET, operating of the two transistors is fundamentally ...

  • Page 8

    Environmental Test Results IGBT / CoPack Quarterly Reliability Report Section 3 Page ...

  • Page 9

    HIGH TEMPERATURE REVERSE BIAS (HTRB) Junction Temperature : Applied Bias: N Channel DEVICE DATE TEMP VOLTAGE QTY TYPE CODE (deg C) IRGPC30FD2 9344 150 IRGPC50FD2 9237 150 TOTALS N Channel DEVICE DATE TEMP VOLTAGE QTY TYPE CODE (deg C) IRGPC40U ...

  • Page 10

    HIGH TEMPERATURE REVERSE BIAS (HTRB) Junction Temperature: Applied Bias: N Channel DEVICE DATE TEMP VOLTAGE QTY TYPE CODE (deg C) IRGBC20S 9544 150 IRGBC40S 9606 150 TOTALS N Channel DEVICE DATE TEMP VOLTAGE QTY TYPE CODE (deg C) IRGBC30F 9537 ...

  • Page 11

    HIGH TEMPERATURE REVERSE BIAS (HTRB) Junction Temperature: Applied Bias: N Channel DEVICE DATE TEMP VOLTAGE QTY TYPE CODE (deg C) IRGBC20K 9613 150 IRGBC30U 9605 150 IRGB440U 9643 150 TOTALS NOTES a. One FIT represents one failure in one billion ...

  • Page 12

    HIGH TEMPERATURE GATE BIAS (HTGB) Junction Temperature: N Channel DEVICE DATE TEMP TYPE CODE (deg C) IRGPF30F 9642 150 IRGPC50FD2 9237 150 TOTALS N Channel DEVICE DATE TEMP TYPE CODE (deg C) IRGPC40U 9538 150 IRGPC40U 9620 150 IRG4PC50U 9721 ...

  • Page 13

    HIGH TEMPERATURE GATE BIAS (HTGB) Junction Temperature: N Channel DEVICE TEMP TYPE (deg C) IRGBC20S 9544 IRGBC40S 9605 TOTALS N Channel DATE TEMP TYPE IRGBC30F 150 IRGBC30FD2 150 IRGBC30FD2 150 IRGBF30F 150 TOTALS NOTES b. FAILURE MODES: I Quarterly Reliability ...

  • Page 14

    HIGH TEMPERATURE GATE BIAS (HTGB) Junction Temperature: Applied Bias: N Channel DEVICE DATE TEMP TYPE CODE (deg C) 9613 150 9605 150 9641 150 9643 150 TOTALS NOTES a. One FIT represents one failure in one billion (1.0E+09) hours. b. ...

  • Page 15

    TEMPERATURE & HUMIDITY (THB) Junction Temperature: Relative Humidity: Applied Bias: N Channel DEVICE TYPE IRGPF30F N Channel DEVICE TYPE IRGPC40U IRGPC40U IRG4PC40UD2 IRGPH60UD2 NOTES b. FAILURE MODES devices failed @ 1504hrs 85/85 and 4 devices failed @ IGBT ...

  • Page 16

    TEMPERATURE & HUMIDITY (THB) Junction Temperature: Relative Humidity: Applied Bias: N Channel DEVICE TYPE IRGBC20S IRGBC30S IRGBC40S TOTALS N Channel DEVICE TYPE IRGBC30F IRGBF30F IRGBC30FD2 TOTALS NOTES b. FAILURE MODES device failed @ 1008hrs 85/85 it was due ...

  • Page 17

    TEMPERATURE & HUMIDITY (THB) Junction Temperature: Relative Humidity: Applied Bias: N Channel DEVICE DATE TYPE CODE IRG4BC30U IRGB440U IRGBC20K TOTALS NOTES b. FAILURE MODES devices failed @ 1008hrs 85/85 all the failures were due to termination structure corrosion, ...

  • Page 18

    TEMPERATURE CYCLING (T/C) Unbiased Temperature Cycle: Cycle time: Bias N Channel DEVICE TYPE IRGPC30FD2 IRGPC50FD2 IRGPC40U IRGPC40U IRGPC40UD2 IRG4PC40UD2 IRG4PC50U IRGPC50UD2 IRGPF30F IRGPH60UD2 TOTALS NOTES b. FAILURE MODES: IGBT / CoPack Quarterly Reliability Report T0247 Package Tmin = - 55°C, ...

  • Page 19

    TEMPERATURE CYCLING (T/C) Unbiased Temperatre Cycle: Cycle Time Bias N Channel DEVICE TYPE IRGBC20S IRGBC40S IRGBC30S IRGBC30F IRGBF30F IRGBC20K IRGBC30U IRG4BC30U IRGB440U IRGBC30FD2 IRGBC30FD2 TOTALS NOTES b. FAILURE MODES: IGBT / CoPack Quarterly Reliability Report T0220 Package Tmin = - ...

  • Page 20

    POWER CYCLING (P/C) unbiased Bias: Temperature: Duration: Test Points: N Channel DEVICE TYPE IRGPC40U TOTALS NOTES b. FAILURE MODES: IGBT / CoPack Quarterly Reliability Report T0247 Package Set to give T = 100° 100°C 10000 Cycles 2500, 5000, ...

  • Page 21

    ACCELERATED MOISTURE RESISTANCE (A/C) Unbiased Pressure: Temperature: Humidity: Bias: N Channel DEVICE TYPE IRGPF30F IRGPC40U IRGPC40U IRG4PC40UD2 IRG4PC50U TOTALS NOTES b. FAILURE MODES: IGBT / CoPack Quarterly Reliability Report T0247 Package 15 Ibs psig 121°C 100% None MID / HIGH ...

  • Page 22

    ACCELERATED MOISTURE RESISTANCE (A/C) Unbiased Pressure: Temperature: Humidity: Bias: N Channel DEVICE TYPE IRGBC20S IRGBC30S IRGBC40S IRGBC30F IRGBF30F IRGBC20K IRGBC30U TOTALS NOTES b. FAILURE MODES: IGBT / CoPack Quarterly Reliability Report T0220 Package 15 Ibs psig 121°C 100% None LOW ...

  • Page 23

    Environmental Test Conditions / Schematics I GBT / CoPack Quarterly Reliability Report Section 4 Page ...

  • Page 24

    HIGH TEMPERATURE REVERSE BIAS (HTRB) Conditions Bias: Vce = As required Temperature: Tmax Duration: 2000 Hours nominal Test points: 168, 500, 1000, 1500, 2000, Hours nominal Purpose High temperature reverse bias (HTRB) burn- stress the devices with the ...

  • Page 25

    HIGH TEMPERATURE GATE BIAS (HTGB) Conditions Bias: Vge = As required Temperature: Tmax Duration: 2000 Hours nominal Test points: 168, 500, 1000, 1500, 2000 Hours nominal. Purpose The purpose of High Temperature Gate Bias is to stress the devices with ...

  • Page 26

    TEMPERATURE & HUMIDITY (THB) Conditions Bias: Vce = 100% of maximum rated 500V: 500V for (BR)CES all devices with rated V greater than 500V * Temperature: 85°C Relative Humidity: 85% Duration: 2000 Hours nominal Test points: 168, ...

  • Page 27

    TEMPERATURE CYCLING (T/C) Unbiased Conditions Temperature: Bias: Duration: Test points: Purpose Temperature Cycling simulates the extremes of thermal stresses which devices will encounter in the actual circuit applications in combination with potentially extreme operating ambient temperatures. Some equipment is destined ...

  • Page 28

    POWER CYCLING (P/C) Unbiased Conditions Bias Set to give Temperature Tj = 100°C Duration 10000 Cycles Test points 2500, 5000, 7500, 10000 Nominal Purpose The purpose of Power Cycling is to simulate the thermal and current pulsing stresses which devices ...

  • Page 29

    ACCELERATEDMOISTURE RESISTANCE (A/C)Unbiased Conditions Temperature: Pressure: Bias: Duration: Test points: Purpose Accelerated Moisture Resistance test is performed to evaluate the moisture resistance of non-hermetic packages. Severe conditions of pressure, humidity and temperature are applied that accelerate the penetration of moisture ...

  • Page 30

    Device Package and Frequency Listings IGBT / CoPack Quarterly Reliability Report Section 5 Page ...

  • Page 31

    Part Number Channel Voltage IRGPC30S N IRGPC40S N IRGPC50S N IRGPH20S N IRGPH30S N IRGPH40S N IRGPH50S N IRGPC20F N IRGPC20M N IRGPC20MD2 N IRGPC30F N IRGPC30M N IRGPC30FD2 N IRGPC30MD2 N IRGPC40F N IRGPC40M N IRGPC40FD2 N IRGPC40MD2 N ...

  • Page 32

    IRGP420U N IRGP430U N IRGP440U N IRGP440UD2 N IRGP450U N IRGP450UD2 N IRGPC20K N IRGPC20U N IRGPC20KD2 N IRGPC30K N IRGPC30U N IRGPC30KD2 N IRGPC30UD2 N IRGPC40K N IRGPC40U N IRGPC40KD2 N IRGPC40UD2 N IRGPC50K N IRGPC50U N IRGPC50KD2 N ...

  • Page 33

    Part Number Channel Voltage IRG4P254S N 250 IRG4PC30S N 600 IRG4PC40S N 600 IRG4PC50S N 600 IRG4PC30F N 600 IRG4PC30FD N 600 IRG4PC40F N 600 IRG4PC40FD N 600 IRG4PC50F N 600 IRG4PC50FD N 600 IRG4PC30U N 600 IRG4PC30UD N 600 ...

  • Page 34

    Part Number Channel Voltage IRGBC20S N IRGBC30S N IRGBC40S N IRGBC20F N IRGBC20M N IRGBC20FD2 N IRGBC20MD2 N IRGBC30F N IRGBC30M N IRGBC30FD2 N IRGBC30MD2 N IRGBC40F N IRGBC40M N IRGBF20F N IRGBF30F N IRGB420U N IRGB420UD2 N IRGB430U N ...

  • Page 35

    Part Number Channel Voltage IRG4BC20S N IRG4BC30S N IRG4BC40S N IRG4BC20F N IRG4BC20FD N IRG4BC30F N IRG4BC30FD N IRG4BC40F N IRG4BC20U N IRG4BC20UD N IRG4BC30U N IRG4BC30UD N IRG4BC30K N IRG4BC40U N IRG4BC40K N IGBT / CoPack Quarterly Reliability Report ...