grm155r71h102ka01 Murata Manufacturing Co., Ltd, grm155r71h102ka01 Datasheet - Page 5

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grm155r71h102ka01

Manufacturer Part Number
grm155r71h102ka01
Description
High Dielectric Constant Type 6.3/16/25/50v
Manufacturer
Murata Manufacturing Co., Ltd
Datasheet

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No.
10
9
Continued from the preceding page.
!Note
Capacitance
Temperature
Characteristics
Adhesive Strength
of Termination
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specification or transact the approval sheet for product specification
• You are able to read a detailed specification in the website (http://search.murata.co.jp/) before to require our product specification or to transact the approval sheet for product specification.
before ordering. Especially, please read rating and !CAUTION (for storage and operating, rating, soldering and mounting, handling) in them to prevent smoking and/or burning, etc.
Item
50% of
the Rated
Voltage
Capacitance
Drift
No bias
Capacitors
Within the specified tolerance
(Table A-1)
Within T0.2% or T0.05pF
(Whichever is larger.)
*Not apply to 1X/25V
No removal of the terminations or other defect should occur
Compensating Type
Temperature
Fig. 1a
Specifications
B1, B3 : WithinT10%
R1, R7 : Within±15%
R6 : WithinT15%
E4 : Within W22/Y56%
F1 : Within W30/Y80%
F5 : Within W22/Y82%
B1 : Within W10/–30%
R1 : Within W15/–40%
F1 : Within W30/–95%
*Initial measurement for high
dielectric constant type
Perform a heat treatment at
150W0/–10°C for one hour
and then set for 48T4 hours
at room temperature.
Perform the initial
measurement.
c
High Dielectric Type
Baked electrode or
copper foil
Solder resist
(Y55D to W125D)
(Y25D to W85D)
(Y55D to W85D)
(W10D to W85D)
(Y25D to W85D)
(Y30D to W85D)
The capacitance change should be measured after 5min. at
each specified temp. stage.
(1)Temperature Compensating Type
The temperature coefficient is determind using the capacitance
measured in step 3 as a reference.
When cycling the temperature sequentially from step 1 through
5 (5C : W25D to W125D/∆C : W20D to W125D : other temp.
coeffs. : W25D to W85D/W20D to W85D) the capacitance
should be within the specified tolerance for the temperature
coefficient and capacitance change as Table A-1.
The capacitance drift is caluculated by dividing the differences
between the maximum and minimum measured values in the
step 1, 3 and 5 by the cap. value in step 3.
(2) High Dielectric Constant Type
The ranges of capacitance change compared with the 20D
value over the temperature ranges shown in the table should
be within the specified ranges.*
In case of applying voltage, the capacitance change should be
measured after 1 more min. with applying voltage in
equilibration of each temp. stage.
Solder the capacitor to the test jig (glass epoxy board) shown in
Fig. 1a using an eutectic solder. Then apply 10N
parallel with the test jig for 10T1 sec.
The soldering should be done either with an iron or using the
reflow method and should be conducted with care so that the
soldering is uniform and free of defects such as heat shock.
*2N (GRp03), 5N (GRp15, GRM18)
GRp03
GRp15
GRM18
GRM21
GRM31
GRM32
GRM43
GRM55
Step
1
2
3
4
5
6
7
8
Type
Step
1
2
3
4
5
–30T3 (for F5)/10 T 3 (for E4)
Reference TemperetureT2
Reference TemperetureT2
Reference TemperetureT2
Reference TemperetureT2
–55T3 (for R1, R7, R6)
–25T3 (for B1, B3, F1)
Temperature (°C)
85T3 (for B1, B3, R6
125T3 (for R1, R7)/
–25T3 (for B1, F1)
85T3 (for B1, F1)
–55T3 (for R1)/
125T3 (for R1)/
F1, F5, E4)
Y55T3 (for ∆C)/Y25T3 (for other TC)
125T3 (for ∆C)/85T3 (for other TC)
0.3
0.4
1.0
1.2
2.2
2.2
3.5
4.5
Test Method
a
Reference TemperatureT2
Reference TemperatureT2
Reference TemperatureT2
Continued on the following page.
Temperature (D)
0.9
1.5
3.0
4.0
5.0
5.0
7.0
8.0
b
Applying Voltage (V)
50% of the rated
*
No bias
voltage
force in
1.65
0.3
0.5
1.2
2.0
2.9
3.7
5.6
(in mm)
c

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