HEF4094BTS NXP [NXP Semiconductors], HEF4094BTS Datasheet
HEF4094BTS
Related parts for HEF4094BTS
HEF4094BTS Summary of contents
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... Type number Package Name HEF4094BP DIP16 HEF4094BT SO16 HEF4094BTS SSOP16 power supply range referenced Description plastic dual in-line package; 16-leads (300 mil) plastic small outline package; 16 leads; body width 3.9 mm plastic shrink small outline package; 16 leads; body width 5.3 mm ...
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NXP Semiconductors 4. Functional diagram D 2 8-STAGE SHIFT CP REGISTER 3 STR 8-BIT STORAGE 1 REGISTER OE 15 3-STATE OUTPUTS QP0 QP1 QP2 QP3 QP4 QP5 QP6 QP7 Fig 1. Functional diagram STAGE 0 ...
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NXP Semiconductors 5. Pinning information 5.1 Pinning Fig 4. Pin configuration 5.2 Pin description Table 2. Pin description Symbol Pin STR QP0 to QP7 14, 13, 12 ...
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NXP Semiconductors [1] Table 3. Function table …continued Inputs CP OE STR H H [1] At the positive clock edge, the information in the 7th register stage is transferred to the 8th register stage and the QSn outputs ...
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NXP Semiconductors 8. Recommended operating conditions Table 5. Recommended operating conditions Symbol Parameter V supply voltage DD V input voltage I T ambient temperature amb t/ V input transition rise and fall rate 9. Static characteristics Table 6. Static characteristics ...
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NXP Semiconductors Table 6. Static characteristics unless otherwise specified Symbol Parameter Conditions I supply current all valid input DD combinations ...
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NXP Semiconductors Table 7. Dynamic characteristics for test circuit see SS amb Symbol Parameter t OFF-state to HIGH PZH propagation delay t OFF-state to LOW PZL propagation delay t HIGH to OFF-state ...
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NXP Semiconductors 11. Waveforms QPn, QS1 output QS2 output Measurement points are given in Logic levels: V and Fig 6. Clock to outputs propagation delays, and clock pulse width and maximum frequency Table 9. Measurement points Supply ...
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NXP Semiconductors OE input LOW-to-OFF OFF-to-LOW HIGH-to-OFF OFF-to-HIGH Measurement points are given in Logic levels: V and Fig 8. 3-state output enable and disable times for OE input QPn, QS1, QS2 output Measurement points are given in ...
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NXP Semiconductors Test data is given in Table Definitions for test circuit: DUT = Device Under Test load capacitance including jig and probe capacitance termination resistance should be equal to the output impedance Z T ...
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NXP Semiconductors 12. Application information Some examples of applications for the HEF4094B are: • Serial-to-parallel data conversion • Remote control holding register DIGITALLY CONTROLLED (REQUIRES CONTINUOUS DIGITAL CONTROL CONTROL AND SYNC CIRCUITRY data clock from remote control ...
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NXP Semiconductors 13. Package outline DIP16: plastic dual in-line package; 16 leads (300 mil pin 1 index 1 DIMENSIONS (inch dimensions are derived from the original mm dimensions UNIT max. min. max. ...
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NXP Semiconductors SO16: plastic small outline package; 16 leads; body width 3 pin 1 index 1 DIMENSIONS (inch dimensions are derived from the original mm dimensions) A UNIT max. 0.25 ...
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NXP Semiconductors SSOP16: plastic shrink small outline package; 16 leads; body width 5 pin 1 index 1 e DIMENSIONS (mm are the original dimensions) A UNIT max. 0.21 1.80 mm ...
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NXP Semiconductors 14. Abbreviations Table 11. Abbreviations Acronym Description DUT Device Under Test ESD ElectroStatic Discharge HBM Human Body Model MM Machine Model 15. Revision history Table 12. Revision history Document ID Release date HEF4094B_4 20081030 • Modifications: The format ...
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NXP Semiconductors 16. Legal information 16.1 Data sheet status [1][2] Document status Product status Objective [short] data sheet Development Preliminary [short] data sheet Qualification Product [short] data sheet Production [1] Please consult the most recently issued document before initiating or ...
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NXP Semiconductors 18. Contents 1 General description . . . . . . . . . . . . . . . . . . . . . . 1 2 Features . . . . . . . . ...