DAC121S101QML_10 NSC [National Semiconductor], DAC121S101QML_10 Datasheet - Page 20

• Manufacturer Part Number: DAC121S101QML_10
• Description: 12-Bit Micro Power Digital-to-Analog Converter with Rail-to-Rail Output
• Manufacturer: NSC [National Semiconductor]

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3.0 Radiation Environments
Careful consideration should be given to environmental con-
ditions when using a product in a radiation environment.
3.1 Total Ionizing Dose
Radiation hardness assured (RHA) products are those part
numbers with a total ionizing dose (TID) level specified in the
Ordering Information table on the front page. Testing and
qualification of these products is done on a wafer level ac-
cording to MIL-STD-883G, Test Method 1019.7, Condition A
and the “Extended room temperature anneal test” described
in section 3.11 for application environment dose rates less
than 0.027 rad(Si)/s. Wafer level TID data is available with lot
shipments.
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3.2 Single Event Latch-Up and
Functional Interrupt
One time single event latch-up (SEL) and single event func-
tional interrupt (SEFI) testing was preformed according to
EIA/JEDEC Standard, EIA/JEDEC57. The linear energy
transfer threshold (LETth) shown in the Key Specifications
table on the front page is the maximum LET tested. A test
report is available upon request.
3.3 Single Event Upset
A report on single event upset (SEU) is available upon re-
quest.