M30622ECTFP MITSUBISHI [Mitsubishi Electric Semiconductor], M30622ECTFP Datasheet - Page 174

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M30622ECTFP

Manufacturer Part Number
M30622ECTFP
Description
SINGLE-CHIP 16-BIT CMOS MICROCOMPUTER
Manufacturer
MITSUBISHI [Mitsubishi Electric Semiconductor]
Datasheet
Usage precaution
Figure 1.24.1. Programming and test flow for One Time PROM version
Usage precaution of built-in PROM version
(1) All built-in PROM versions
(2) One Time PROM version
High voltage is required to program to the built-in PROM. Be careful not to apply excessive voltage.
Be especially careful during power-on.
One Time PROM versions shipped in blank (M30622ECTFP/ECVFP, M30623ECTGP/ECVGP), of
which built-in PROMs are programmed by users, are also provided. For these microcomputers, a
programming test and screening are not performed in the assembly process and the following pro-
cesses. To improve their reliability after programming, we recommend to program and test as flow
shown in Figure 1.24.1 before use.
But, in case of using as the test of cars loading, mass production, correspond to programming PROM,
and screened shipped in programming, please require.
Tentative Specifications REV.A
S
pecifications in this manual are tentative and subject to change.
Note 1: Never expose to 150˚C exceeding 100 hours.
Note 2: Test in responce to using temperature limit.
(high temperature, low temperature)
ROM data check in all numbers, target device
Programming with PROM programmer
Verify test PROM programmer
(Leave at 150˚C for 40 hours)
Screening (Note 1)
174
(Note 2)
Vcc=5.5V, 5.0V, 4.5V
SINGLE-CHIP 16-BIT CMOS MICROCOMPUTER
Mitsubishi microcomputers
M16C / 62T Group

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