CY37128P84125JXI

Manufacturer Part NumberCY37128P84125JXI
DescriptionPLCC
ManufacturerCypress Semiconductor Corporation.
CY37128P84125JXI datasheet
 


Specifications of CY37128P84125JXI

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5.0V Device Characteristics
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
Operating Range
[2]
Range
Ambient Temperature
Commercial
0°C to +70°C
Industrial
–40°C to +85°C
[3]
Military
–55°C to +125°C
5.0V Device Electrical Characteristics
Parameter
Description
V
Output HIGH Voltage
OH
V
Output HIGH Voltage with
OHZ
[5]
Output Disabled
V
Output LOW Voltage
OL
V
Input HIGH Voltage
IH
V
Input LOW Voltage
IL
I
Input Load Current
IX
I
Output Leakage Current
OZ
[5, 8]
I
Output Short Circuit Current
OS
I
Input Bus-Hold LOW
BHL
Sustaining Current
I
Input Bus-Hold HIGH
BHH
Sustaining Current
I
Input Bus-Hold LOW
BHLO
Overdrive Current
I
Input Bus-Hold HIGH
BHHO
Overdrive Current
Notes:
2. Normal Programming Conditions apply across Ambient Temperature Range for specified programming methods. For more information on programming the
Ultra37000 Family devices, please refer to the Application Note titled “An Introduction to In System Reprogramming with the Ultra37000.”
3. T
is the “Instant On” case temperature.
A
4. I
= –2 mA, I
= 2 mA for TDO.
OH
OL
5. Tested initially and after any design or process changes that may affect these parameters.
6. When the I/O is output disabled, the bus-hold circuit can weakly pull the I/O to above 3.6V if no leakage current is allowed. Note that all I/Os are output disabled
during ISR programming. Refer to the application note “Understanding Bus-Hold” for additional information.
7. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
8. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. V
problems caused by tester ground degradation.
Document #: 38-03007 Rev. *E
DC Voltage Applied to Outputs
in High-Z State................................................–0.5V to +7.0V
DC Input Voltage ............................................–0.5V to +7.0V
DC Program Voltage............................................. 4.5 to 5.5V
Current into Outputs .................................................... 16 mA
Static Discharge Voltage........................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current..................................................... > 200 mA
[2]
Junction Temperature
Output Condition
0°C to +90°C
–40°C to +105°C
–55°C to +130°C
Over the Operating Range
Test Conditions
V
= Min.
I
= –3.2 mA (Com’l/Ind)
CC
OH
I
= –2.0 mA (Mil)
OH
= 0 µA (Com’l)
V
= Max.
I
CC
OH
= 0 µA (Ind/Mil)
I
OH
= –100 µA (Com’l)
I
OH
= –150 µA (Ind/Mil)
I
OH
V
= Min.
I
= 16 mA (Com’l/Ind)
CC
OL
I
= 12 mA (Mil)
OL
Guaranteed Input Logical HIGH Voltage for all Inputs
Guaranteed Input Logical LOW Voltage for all Inputs
V
= GND OR V
, Bus-Hold Disabled
I
CC
V
= GND or V
, Output Disabled, Bus-Hold Disabled
O
CC
V
= Max., V
= 0.5V
CC
OUT
V
= Min., V
= 0.8V
CC
IL
V
= Min., V
= 2.0V
CC
IH
V
= Max.
CC
V
= Max.
CC
Ultra37000 CPLD Family
V
V
CC
CCO
5V ± 0.25V
5V ± 0.25V
5V
5V ± 0.25V
3.3V ± 0.3V
3.3V
5V ± 0.5V
5V ± 0.5V
5V
5V ± 0.5V
3.3V ± 0.3V
3.3V
5V ± 0.5V
5V ± 0.5V
5V
5V ± 0.5V
3.3V ± 0.3V
3.3V
Min. Typ.
Max.
Unit
[4]
2.4
V
[4]
2.4
V
[6]
4.2
V
[6]
4.5
V
[6]
3.6
V
[6]
3.6
V
[4]
0.5
V
[4]
0.5
V
[7]
2.0
V
V
CCmax
[7]
–0.5
0.8
V
µA
–10
10
µA
–50
50
–30
–160
mA
µA
+75
µA
–75
µA
+500
µA
–500
= 0.5V has been chosen to avoid test
OUT
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