K4H560438E-VC SAMSUNG [Samsung semiconductor], K4H560438E-VC Datasheet

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K4H560438E-VC

Manufacturer Part Number
K4H560438E-VC
Description
256Mb E-die DDR SDRAM Specification 54 sTSOP-II with Pb-Free (RoHS compliant)
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet
DDR SDRAM 256Mb E-die (x4, x8) Pb-Free
DDR SDRAM
256Mb E-die DDR SDRAM Specification
54 sTSOP-II with Pb-Free
(RoHS compliant)
(300mill x 551mil)
Revision 1.1
October, 2004
Rev. 1.1 October, 2004

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K4H560438E-VC Summary of contents

Page 1

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free 256Mb E-die DDR SDRAM Specification 54 sTSOP-II with Pb-Free (RoHS compliant) (300mill x 551mil) Revision 1.1 October, 2004 DDR SDRAM Rev. 1.1 October, 2004 ...

Page 2

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free 256Mb E-die Revision History Revision 1.0 (February, 2004) -First release Revision 1.1 (October, 2004) -Corrected typo. DDR SDRAM Rev. 1.1 October, 2004 ...

Page 3

... Maximum burst refresh cycle : 8 • 54pin sTSOP(II)-300 Pb-Free package • RoHS compliant Ordering Information Part No. K4H560438E-VC/LB3 K4H560438E-VC/LA2 K4H560438E-VC/LB0 K4H560838E-VC/LB3 K4H560838E-VC/LA2 K4H560838E-VC/LB0 Operating Frequencies B3(DDR333@CL=2.5) Speed @CL2 Speed @CL2.5 *CL : CAS Latency Org. ...

Page 4

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Pin Description 54pin sTSOP(II)-300 VDD VDD DQ0 NC VDDQ VDDQ DQ1 DQ0 VSSQ VSSQ NC DQ2 VDDQ VDDQ DQ3 DQ1 VSSQ VSSQ NC NC VDDQ VDDQ VDD VDD WE WE CAS CAS RAS RAS ...

Page 5

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Package Physical Dimension 54pin sTSOP(II)-300 #54 (1.00) #1 (0.50) 0.50±0.05 NOTE REFERENCE ASS’Y OUT QUALITY #28 (∅ 2.00 Dp0~0.05 BTM) #27 14.40MAX (14.20) ° 14.00±0.10 (14 ) +0.075 0.50TYP 0.20 -0.035 ° ( 0.07 MAX DDR SDRAM Units : Millimeters (2-R 0.30) (2-R 0.15) ° (14 ) +0.075 0.125 -0.035 ...

Page 6

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Block Diagram (16Mbit x 4 Bank Select CK, CK ADD LCKE LRAS LCBR CK, CK CKE / 8Mbit Banks) x4/8 CK, CK Data Input Register Serial to parallel x8/16 8Mx8/ 4Mx16 8Mx8/ 4Mx16 8Mx8/ 4Mx16 8Mx8/ 4Mx16 Column Decoder Latency & Burst Length ...

Page 7

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Input/Output Function Description SYMBOL TYPE CK, CK Input CKE Input CS Input RAS, CAS, WE Input DM Input BA0, BA1 Input 12] Input DQ I/O DQS I VDDQ Supply VSSQ Supply VDD Supply VSS Supply VREF Input Clock : CK and CK are differential clock inputs. All address and control input signals are sam- pled on the positive edge of CK and negative edge of CK ...

Page 8

... Burst stop command is valid at every burst length. 8. DM(x4/8) sampled at the rising and falling edges of the DQS and Data-in are masked at the both edges (Write DM latency is 0). 9. This combination is not defined for any function, which means "No Operation(NOP)" in DDR SDRAM. CKEn-1 CKEn ...

Page 9

... Banks / 8M x 8Bit x 4 Banks Double Data Rate SDRAM General Description The K4H560438E / K4H560838E is 268,435,456 bits of double data rate synchronous DRAM organized as 4x 16,777,216 / 4x 8,388,608 words bits, fabricated with SAMSUNG′s high performance CMOS technology. Synchronous features with Data Strobe allow extremely high performance up to 333Mb/s per pin ...

Page 10

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free DDR SDRAM Spec Items & Test Conditions Operating current - One bank Active-Precharge; tRC=tRCmin; tCK=10ns for DDR200, 7.5ns for DDR266, 6ns for DDR333; DQ,DM and DQS inputs changing once per clock cycle; address and control inputs changing once every two clock cycles. ...

Page 11

... IDD4W IDD5 Normal IDD6 Low power IDD7A Symbol B3(DDR333@CL=2.5) IDD0 IDD1 IDD2P IDD2F IDD2Q IDD3P IDD3N IDD4R IDD4W IDD5 Normal IDD6 Low power IDD7A 64Mx4 (K4H560438E) A2(DDR266@CL=2. 110 110 140 120 160 135 170 160 ...

Page 12

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free < Detailed test conditions for DDR SDRAM IDD1 & IDD7A > IDD1 : Operating current: One bank operation 1. Only one bank is accessed with tRC(min), Burst Mode, Address and Control inputs on NOP edge are changing once per clock cycle. lout = 0mA 2 ...

Page 13

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free AC Operating Conditions Parameter/Condition Input High (Logic 1) Voltage, DQ, DQS and DM signals Input Low (Logic 0) Voltage, DQ, DQS and DM signals. Input Differential Voltage, CK and /CK inputs Input Crossing Point Voltage, CK and /CK inputs Notes : 1. VID is the magnitude of the difference between the input level on CK and the input level on /CK. ...

Page 14

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Overshoot/Undershoot specification for Data, Strobe, and Mask Pins Maximum peak amplitude allowed for overshoot Maximum peak amplitude allowed for undershoot The area between the overshoot signal and VDD must be less than or equal to The area between the undershoot signal and GND must be less than or equal to ...

Page 15

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free AC Timming Parameters & Specifications Parameter Row cycle time Refresh row cycle time Row active time RAS to CAS delay Row precharge time Row active to Row active delay Write recovery time Last data in to Read command Col. address to Col. address delay ...

Page 16

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Parameter Mode register set cycle time DQ & DM setup time to DQS DQ & DM hold time to DQS Control & Address input pulse width DQ & DM input pulse width Power down exit time Exit self refresh to non-Read command Exit self refresh to read command ...

Page 17

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Table 4 : Input/Output Setup & Hold Derating for Rise/Fall Delta Slew Rate Delta Slew Rate tDS +/- 0.0 V/ns 0 +/- 0.25 V/ns +50 +/- 0.5 V/ns +100 Table 5 : Output Slew Rate Characteristice (X4, X8 Devices only) Typical Range Slew Rate Characteristic (V/ns) Pullup Slew Rate 1.2 ~ 2.5 Pulldown slew 1 ...

Page 18

... DQS will be tran sitioning from High logic LOW previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device. 5. For command/address input slew rate ≥ 1.0 V/ns 6. For command/address input slew rate ≥ ...

Page 19

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free b. Pulldown slew rate is measured under the test conditions shown in Figure 2. Output Figure 2 : Pulldown slew rate test load c. Pullup slew rate is measured between (VDDQ/2 - 320 mV +/- 250 mV) Pulldown slew rate is measured between (VDDQ/2 + 320 mV +/- 250 mV) Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs switching and only one output switching ...

Page 20

... DDR SDRAM Output Driver V-I Characteristics DDR SDRAM Output driver characteristics are defined for full and half strength operation as selected by the EMRS bit A1. Figures 3 and 4 show the driver characteristics graphically, and tables 8 and 9 show the same data in tabular format suitable for input into simulation tools ...

Page 21

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 6.0 6.8 0.2 12.2 13.5 0.3 18.1 20.1 0.4 24.1 26.6 0.5 29.8 33.0 0.6 34.6 39.1 0.7 39.4 44.2 0.8 43.7 49.8 0.9 47.5 55.2 1.0 51.3 60.3 1.1 54.1 65.2 1.2 56.2 69.9 1.3 57.9 74.2 1.4 59.3 78.4 1.5 60.1 82.3 1.6 60.5 85.9 1.7 61.0 89.1 1.8 61.5 92.2 1.9 62.0 95.3 2.0 62.5 97.2 2.1 62.9 99.1 2.2 63.3 100.9 2.3 63.8 101.9 2.4 64.1 102.8 2.5 64.6 103.8 2.6 64.8 104.6 2.7 65.0 105.4 Minimum Maximum 4.6 9.6 9.2 18.2 13.8 26.0 18.4 33.9 23.0 41.8 27.7 49.4 32.2 56.8 36.8 63.2 39.6 69.9 42.6 76.3 44.8 82.5 46.2 88.3 47.1 93.8 47.4 99.1 47.7 103.8 48.0 108.4 48.4 112.1 48.9 115.9 49.1 119.6 49.4 123.3 49.6 126.5 49.8 129.5 49.9 132.4 50.0 135.0 50.2 137.3 50.4 139.2 50.5 140.8 Table 7. Full Strength Driver Characteristics DDR SDRAM ...

Page 22

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free 0.0 Pullup Characteristics for Weak Output Driver 0.0 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 Pulldown Characteristics for Weak Output Driver Figure 4. I/V characteristics for input/output buffers:Pull up(above) and pull down(below) 1.0 2.0 1.0 2.0 DDR SDRAM Maximum Typical High ...

Page 23

... DDR SDRAM 256Mb E-die (x4, x8) Pb-Free Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 3.4 3.8 0.2 6.9 7.6 0.3 10.3 11.4 0.4 13.6 15.1 0.5 16.9 18.7 0.6 19.6 22.1 0.7 22.3 25.0 0.8 24.7 28.2 0.9 26.9 31.3 1.0 29.0 34.1 1.1 30.6 36.9 1.2 31.8 39.5 1.3 32.8 42.0 1.4 33.5 44.4 1.5 34.0 46.6 1.6 34.3 48.6 1.7 34.5 50.5 1.8 34.8 52.2 1.9 35.1 53.9 2.0 35.4 55.0 2.1 35.6 56.1 2.2 35.8 57.1 2.3 36.1 57.7 2.4 36.3 58.2 2.5 36.5 58.7 2.6 36.7 59.2 2.7 36.8 59.6 Minimum Maximum 2.6 5.0 5.2 9.9 7.8 14.6 10.4 19.2 13.0 23.6 15.7 28.0 18.2 32.2 20.8 35.8 22.4 39.5 24.1 43.2 25.4 46.7 26.2 50.0 26.6 53.1 26.8 56.1 27.0 58.7 27.2 61.4 27.4 63.5 27.7 65.6 27.8 67.7 28.0 69.8 28.1 71.6 28.2 73.3 28.3 74.9 28.3 76.4 28.4 77.7 28.5 78.8 28.6 79.7 Table 8. Weak Driver Characteristics DDR SDRAM pullup Current (mA) Typical Typical Minimum Low High -3.5 -4.3 -2.6 -6.9 -8.2 -5.2 -10.3 -12.0 -7.8 -13.6 -15.7 -10.4 -16.9 -19.3 -13.0 -19.4 -22.9 -15.7 -21.5 -26.5 -18.2 -23.3 -30.1 -20.4 -24.8 -33.6 -21.6 -26.0 -37.1 -21.9 -27.1 -40.3 -22.1 -27.8 -43.1 -22.2 -28.3 -45.8 -22.3 -28.6 -48.4 -22.4 -28.7 -50.7 -22.6 -28.9 -52.9 -22.7 -28.9 -55.0 -22.7 -29.0 -56.8 -22.8 -29.2 -58.7 -22.9 -29.2 -60.0 -22.9 -29.3 -61.2 -23.0 -29.5 -62.4 -23.0 -29.5 -63.1 -23.1 -29.6 -63.8 -23.2 -29.7 -64.4 -23.2 -29.8 -65.1 -23.3 -29.9 -65.8 -23.3 Rev. 1.1 October, 2004 Maximum -5.0 -9.9 -14.6 -19.2 -23.6 -28.0 -32.2 -35.8 -39.5 -43.2 -46.7 -50.0 -53.1 -56.1 -58.7 -61.4 -63.5 -65.6 -67.7 -69.8 -71.6 -73.3 -74.9 -76.4 -77.7 -78.8 -79.7 ...

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