HY5DU281622DLT HYNIX [Hynix Semiconductor], HY5DU281622DLT Datasheet

no-image

HY5DU281622DLT

Manufacturer Part Number
HY5DU281622DLT
Description
128Mb-S DDR SDRAM
Manufacturer
HYNIX [Hynix Semiconductor]
Datasheet
This document is a general product description and is subject to change without notice. Hynix semiconductor does not assume
any responsibility for use of circuits described. No patent licenses are implied.
Rev. 0.0/Apr. 2003
128Mb-S DDR SDRAM
HY5DU281622D(L)T
HY5DU28422D(L)T
HY5DU28822D(L)T
HY5DU28422D(L)T
HY5DU28822D(L)T
HY5DU281622D(L)T
1

Related parts for HY5DU281622DLT

HY5DU281622DLT Summary of contents

Page 1

DDR SDRAM HY5DU28422D(L)T HY5DU28822D(L)T HY5DU281622D(L)T This document is a general product description and is subject to change without notice. Hynix semiconductor does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev. 0.0/Apr. 2003 ...

Page 2

Revision History 1. Rev 0.0 (Apr. 2003) 1) Datasheet Release in Preliminary version Rev. 0.0 / Apr. 2003 HY5DU28422D(L)T HY5DU28822D(L)T HY5DU281622D(L)T 2 ...

Page 3

DESCRIPTION The HY5DU28422D(L)T, HY5DU28822D(L)T and HY5DU281622D(L)T are a 134,217,728-bit CMOS Double Data Rate(DDR) Synchronous DRAM, ideally suited for the main memory applications which requires large memory density and high bandwidth. This Hynix 128Mb DDR SDRAMs offer fully synchronous operations referenced ...

Page 4

PIN CONFIGURATION x4 x8 VDD VDD NC DQ0 VDDQ VDDQ NC NC DQ0 DQ1 VSSQ VSSQ DQ2 VDDQ VDDQ NC NC DQ1 DQ3 VSSQ VSSQ VDDQ VDDQ VDD VDD ...

Page 5

PIN DESCRIPTION PIN TYPE CK, /CK Input CKE Input /CS Input BA0, BA1 Input A0 ~ A11 Input /RAS, /CAS, /WE Input DM Input (LDM,UDM) DQS I/O (LDQS,UDQS Supply Supply DDQ SSQ ...

Page 6

FUNCTIONAL BLOCK DIAGRAM (32Mx4) 4Banks x 8Mbit x 4 I/O Double Data Rate Synchronous DRAM CLK /CLK CKE /CS Command /RAS Decoder /CAS /WE DM A0~A11 Address Buffer BA0,BA1 Rev. 0.0 / Apr. 2003 Write Data Register 2-bit Prefetch Unit ...

Page 7

FUNCTIONAL BLOCK DIAGRAM (16Mx8) 4Banks x 4Mbit x 8 I/O Double Data Rate Synchronous DRAM CLK /CLK CKE /CS Command /RAS Decoder /CAS /WE DM A0~A11 Address Buffer BA0, BA1 Rev. 0.0 / Apr. 2003 Write Data Register 2-bit Prefetch ...

Page 8

FUNCTIONAL BLOCK DIAGRAM (8Mx16) 4Banks x 2Mbit x 16 I/O Double Data Rate Synchronous DRAM CLK /CLK CKE /CS Command /RAS Decoder /CAS /WE LDM UDM A0~A11 Address Buffer BA0, BA1 Rev. 0.0 / Apr. 2003 Write Data Register 2-bit ...

Page 9

SIMPLIFIED COMMAND TRUTH TABLE Command CKEn-1 Extended Mode Register Set Mode Register Set Device Deselect No Operation Bank Active Read Read with Autoprecharge Write Write with Autoprecharge Precharge All Banks Precharge selected Bank Read Burst Stop Auto Refresh Entry Self ...

Page 10

WRITE MASK TRUTH TABLE Function CKEn-1 Data Write Data-In Mask Note : 1. Write Mask command masks burst write data with reference to LDQS/UDQS(Data Strobes) and it is not related with read data. In case of x16 data I/O, LDM ...

Page 11

OPERATION COMMAND TRUTH TABLE-I Current /CS /RAS State IDLE ROW L H ACTIVE L ...

Page 12

OPERATION COMMAND TRUTH TABLE-II Current /CS /RAS State WRITE READ WITH L H AUTOPRE CHARGE ...

Page 13

OPERATION COMMAND TRUTH TABLE-III Current /CS /RAS State ROW L H ACTIVATING WRITE L H RECOVERING ...

Page 14

OPERATION COMMAND TRUTH TABLE-IV Current /CS /RAS State WRITE MODE L H REGISTER ACCESSING ...

Page 15

CKE FUNCTION TRUTH TABLE Current CKEn- CKEn State SELF REFRESH POWER DOWN ...

Page 16

SIMPLIFIED STATE DIAGRAM MODE REGISTER SET POWER DOWN READ WRITE READAP WRITE WRITEAP PRE(PALL) Rev. 0.0 / Apr. 2003 MRS SREF IDLE SREX PDEN PDEX AREF ACT POWER DOWN PDEN PDEX BANK ACTIVE WRITE READ WITH WITH AUTOPRE- AUTOPRE- CHARGE ...

Page 17

POWER-UP SEQUENCE AND DEVICE INITIALIZATION DDR SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined operation. Power must first be applied to VDD, then to VDDQ, and finally ...

Page 18

Issue 2 or more Auto Refresh commands. 8. Issue a Mode Register Set command to initialize the mode register with bit A8 = Low Power-Up Sequence VDD VDDQ tVTD VTT VREF /CLK CLK CKE CMD DM ADDR A10 BA0,BA1 ...

Page 19

MODE REGISTER SET (MRS) The mode register is used to store the various operating modes such as /CAS latency, addressing mode, burst length, burst type, test mode, DLL reset. The mode register is programed via MRS command. This command is ...

Page 20

BURST DEFINITION Burst Length Starting Address (A2,A1,A0 BURST LENGTH & TYPE Read and write accesses to the DDR SDRAM are burst oriented, with the burst length being programmable. The burst length determines the maximum number of column ...

Page 21

CAS LATENCY The Read latency or CAS latency is the delay in clock cycles between the registration of a Read command and the availability of the first burst of output data. The latency can be programmed 2, 2 ...

Page 22

EXTENDED MODE REGISTER SET (EMRS) The Extended Mode Register controls functions beyond those controlled by the Mode Register; these additional func- tions include DLL enable/disable, output driver strength selection(optional). These functions are controlled via the bits shown below. The Extended ...

Page 23

ABSOLUTE MAXIMUM RATINGS Parameter Ambient Temperature Storage Temperature Voltage on Any Pin relative Voltage on V relative Voltage on V relative to V DDQ SS Output Short Circuit Current Power Dissipation Soldering Temperature ...

Page 24

DC CHARACTERISTICS II 32Mx4 Parameter Symbol Operating Current IDD0 Operating Current I DD1 Precharge Power Down I DD2P Standby Current Idle Standby Current I DD2N Idle Standby Current I DD2F Idle Quiet Standby Current I DD2Q Active Power Down I ...

Page 25

DC CHARACTERISTICS II 16Mx8 Parameter Symbol One bank; Active - Precharge ; tRC=tRC(min); tCK=tCK(min) ; DQ,DM and DQS inputs changing twice per Operating Current IDD0 clock cycle; address and control inputs changing once per clock cycle One bank; Active - ...

Page 26

DC CHARACTERISTICS II 8Mx16 Parameter Symbol One bank; Active - Precharge ; tRC=tRC(min); tCK=tCK(min) ; DQ,DM and DQS inputs changing twice per Operating Current IDD0 clock cycle; address and control inputs changing once per clock cycle One bank; Active - ...

Page 27

DETAILED TEST CONDITIONS FOR DDR SDRAM IDD1 & IDD7 IDD1 : Operating current: One bank operation 1. Typical Case : VDD = 2.6V, T=25 2. Worst Case : VDD = 2.7V Only one bank is accessed with ...

Page 28

AC OPERATING CONDITIONS Parameter Input High (Logic 1) Voltage, DQ, DQS and DM signals Input Low (Logic 0) Voltage, DQ, DQS and DM signals Input Differential Voltage, CK and /CK inputs Input Crossing Point Voltage, CK and /CK inputs Note ...

Page 29

AC CHARACTERISTICS I Parameter Row Cycle Time Auto Refresh Row Cycle Time Row Active Time Active to Read with Auto Precharge Delay Row Address to Column Address Delay Row Active to Row Active Delay Column Address to Column Address Delay ...

Page 30

Parameter Input Pulse Width Write DQS High Level Width Write DQS Low Level Width Clock to First Rising edge of DQS-In DQS falling edge to CK setup time DQS falling edge hold time from CK Data-In Setup Time to DQS-In ...

Page 31

CK, /CK slew rates are >=1.0V/ns 6. These parameters guarantee device timing, but they are not necessarily tested on each device, and they may be guaranteed by design or tester correlation. 7. Data latched at both rising and falling ...

Page 32

CAPACITANCE o (T =25 C, f=100MHz ) A Parameter Input Clock Capacitance Delta Input Clock Capacitance Input Capacitance Delta Input Capacitance Input / Output Capacitanc Delta Input / Output Capacitance Note : 1. VDD = min. to max., VDDQ = ...

Page 33

PACKAGE INFORMATION 400mil 66pin Thin Small Outline Package 0.65 (0.0256) BSC 1.194 (0.0470) 0.991 (0.0390) Rev. 0.0 / Apr. 2003 BASE PLANE 22.33 (0.879) 22.12 (0.871) 0.35 (0.0138) 0.25 (0.0098) SEATING PLANE HY5DU28422D(L)T HY5DU28822D(L)T HY5DU281622D(L)T Unit : mm(Inch) 11.94 (0.470) ...

Related keywords