SiT8102AI-13-18E-14.31818 SiTime, SiT8102AI-13-18E-14.31818 Datasheet
SiT8102AI-13-18E-14.31818
Specifications of SiT8102AI-13-18E-14.31818
Related parts for SiT8102AI-13-18E-14.31818
SiT8102AI-13-18E-14.31818 Summary of contents
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... Extremely low RMS phase jitter (random) • 0.5 ps (typical) • Wide frequency range • 200 MHz • Operating voltage • 1.8, 2.5, 2.8V or 3.3 V • 2. 3.63 V (contact SiTime) • Operating temperature range • Industrial, - °C • Extended Commercial, - °C • Commercial °C • Small footprint • ...
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... The output driver strength can be programmed to drive up to 30pF load. Please contact factory for this option. System reliability is also increased with the SiT8102 by elimi- nating the quartz crystal and improved immunity to the environmental effects of vibration, shock, strain, and humidity. To order samples www.sitime.com and click on Request Sample” link. Min. -65 -0.5 – ...
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SiT8102 DC Electrical Specifications @VDD = 3.3V ±10%, -40 to 85°C Parameter Condition Output Voltage High IOH = -9 mA Output Voltage Low IOL = 9 mA Input Voltage High Pin 1 Input Voltage Low Pin 1 Operating Current Output ...
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SiT8102 AC Electrical Specifications @VDD = 3.3V ±10%, -40 to 85°C Parameter Condition Clock Output Frequency Frequency Stability Inclusive of initial tolerance, operating temp., rated power supply voltage change, load change Aging First year @ 25 °C Clock Output Duty ...
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SiT8102 @VDD = 1.8V ±5%, -40 to 85°C Parameter Condition Clock Output Frequency Frequency Stability Inclusive of initial tolerance, operating temp., rated power supply voltage change, load change Aging First year @ 25 °C Clock Output Duty Cycle Output frequency= ...
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SiT8102 [3] Package Information Dimension (mm) 2.5 x 2.0 x 0.85mm 2.5±0.10 0.8 3.2 x 2.5 x 0.85mm 3.2±0.15 5.0 x 3.2 x 0.85mm 5.0±0.15 Land Pattern (recommended) (mm) 1.0 2.1 0.9 2.39 1.2 Page [4] 1.9 ...
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... SiTime Corporation 2008. The information contained herein is subject to change at any time without notice. SiTime assumes no responsibility or liability for any loss, damage or defect of a Product which is caused in whole or in part by (i) use of any circuitry other than circuitry embodied in a SiTime product, (ii) misuse or abuse including static discharge, neglect or accident, (iii) unauthorized modification or repairs which have been soldered or altered during assembly and are not capable of being tested by SiTime under its normal test conditions, or (iv) improper installation, storage, handling, warehousing or transportation, or (v) being subjected to unusual physical, thermal, or electrical stress ...