71V3558S166PFG8 IDT, 71V3558S166PFG8 Datasheet - Page 15

• Manufacturer Part Number: 71V3558S166PFG8
• Description: SRAM
• Manufacturer: IDT

Specifications of 71V3558S166PFG8

• Rohs: yes
• Part # Aliases: IDT71V3558S166PFG8

DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
NOTE:
1. The LBO, TMS, TDI, TCK and TRST pins will be internally pulled to V
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
NOTES:
1. All values are maximum guaranteed values.
2. At f = f
3. For I/Os V
4. Only available in 256K x 18 configuration.
AC Test Loads
(Typical, ns)
IDT71V3556, IDT71V3558, 128K x 36, 256K x 18, 3.3V Synchronous SRAMS with
ZBT™ ™ ™ ™ ™ Feature, 3.3V I/O, Burst Counter, and Pipelined Outputs
Symbol
Symbol
I
I
I
I
SB1
SB2
SB3
ΔtCD
DD
V
V
|I
|I
|I
LO
OL
OH
LI
LI
|
|
|
MAX,
Power Supply Current
Idle Power
Figure 2. Lumped Capacitive Load, Typical Derating
Operating Power
Supply Current
CMOS Standby
Clock Running Power
Supply Current
Supply Current
HD
inputs are cycling at the maximum frequency of read cycles of 1/t
6
5
4
3
2
1
= V
Input Leakage Current
LBO, JTAG and ZZ Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Parameter
DDQ
20 30 50
– 0.2V, V
LD
I/O
= 0.2V. For other inputs V
Capacitance (pF)
Device Selected, Outputs Open,
Device Deselected, Outputs Open,
Device Deselected, Outputs Open,
Device Selected, Outputs Open,
80
ADV/LD = X, V
V
V
= 0
V
= f
CEN > V
V
Parameter
IN
DD
DD
IN
MAX
(2,3)
> V
> V
= Max., V
= Max., V
100
(2.3)
IH
HD
IH
or < V
Test Conditions
Z
, V
or < V
Figure 1. AC Test Load
0
DD
= 50Ω
IN
IN
DD
IL
= Max.,
> V
> V
LD
, f = f
= Max.,
, f = f
HD
HD
HD
(1)
= V
MAX
or < V
or < V
50Ω
MAX
DD
(2)
V
DD
(2,3)
DDQ
– 0.2V, V
5281 drw 05
LD
LD
5281 drw 04
200
and ZZ will be internally pulled if they are not actively driven in the application.
, f
, f
/2
I
I
V
V
V
OL
OH
CYC
DD
DD
OUT
LD
= +8mA, V
6.42
= -8mA, V
Com'l Only
; f=0 means no input lines are changing.
= Max., V
= Max., V
,
,
200MHz
= 0.2V.
15
= 0V to V
400
130
AC Test Conditions
(V
40
40
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
AC Test Load
DDQ
(4)
DD
DD
IN
IN
DDQ
(V
(1)
Test Conditions
= 0V to V
= 0V to V
= Min.
= Min.
= 3.3V)
Com'l
, Device Deselected
DD
350
120
40
40
(V
166MHz
= 3.3V +/-5%)
DD
DD
DD
Commercial and Industrial Temperature Ranges
= 3.3V +/-5%)
360
Ind
130
45
45
Com'l
300
110
40
40
133MHz
310
120
Ind
45
45
Min.
2.4
___
___
___
___
Com'l
250
100
40
40
100MHz
See Figure 1
0 to 3V
Max.
Ind
255
110
0.4
45
45
1.5V
1.5V
30
___
2ns
5
5
5281 tbl 22
Unit
5281 tbl 21
mA
mA
mA
mA
5281 tbl 23
Unit
µA
µA
µA
V
V