CY7C1315JV18-300BZC Cypress Semiconductor Corp, CY7C1315JV18-300BZC Datasheet

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CY7C1315JV18-300BZC

Manufacturer Part Number
CY7C1315JV18-300BZC
Description
IC SRAM SYNC 18KB QDR2 165LFBGA
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY7C1315JV18-300BZC

Format - Memory
RAM
Memory Type
SRAM - Synchronous, QDR II
Memory Size
18M (512K x 36)
Speed
300MHz
Interface
Parallel
Voltage - Supply
1.7 V ~ 1.9 V
Operating Temperature
0°C ~ 70°C
Package / Case
165-LFBGA
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1315JV18-300BZC
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Features
Selection Guide
Cypress Semiconductor Corporation
Document Number: 001-12562 Rev. *D
Maximum Operating Frequency
Maximum Operating Current
Separate Independent Read and Write Data Ports
300 MHz Clock for High Bandwidth
4-word Burst for reducing Address Bus Frequency
Double Data Rate (DDR) interfaces on both read and write ports
(data transferred at 600 MHz) at 300 MHz
Two Input Clocks (K and K) for Precise DDR Timing
Two Input Clocks for Output Data (C and C) to minimize Clock
Skew and Flight Time mismatches
Echo Clocks (CQ and CQ) simplify Data Capture in High Speed
Systems
Single Multiplexed Address Input Bus latches Address Inputs
for both Read and Write Ports
Separate Port Selects for Depth Expansion
Synchronous Internally Self-timed Writes
QDR
Lock Loop (DLL) is enabled
Operates like a QDR I device with 1 Cycle Read Latency in
DLL Off Mode
Available in x8, x9, x18, and x36 configurations
Full Data Coherency, providing most current Data
Core V
Available in 165-Ball FBGA Package (13 x 15 x 1.4 mm)
Offered in both Pb-free and non Pb-free packages
Variable Drive HSTL Output Buffers
JTAG 1149.1 Compatible Test Access Port
Delay Lock Loop (DLL) for Accurate Data Placement
Supports concurrent transactions
SRAM uses rising edges only
®
II Operates with 1.5 Cycle Read Latency when the Delay
DD
= 1.8 (±0.1V); IO V
Description
DDQ
= 1.4V to V
DD
198 Champion Court
x18
x36
x8
x9
18-Mbit QDR
Configurations
CY7C1311JV18 – 2M x 8
CY7C1911JV18 – 2M x 9
CY7C1313JV18 – 1M x 18
CY7C1315JV18 – 512K x 36
Functional Description
The CY7C1311JV18, CY7C1911JV18, CY7C1313JV18, and
CY7C1315JV18 are 1.8V Synchronous Pipelined SRAMs,
equipped with QDR II architecture. QDR II architecture consists
of two separate ports: the read port and the write port to access
the memory array. The read port has dedicated data outputs to
support read operations and the write port has dedicated data
inputs to support write operations. QDR II architecture has
separate data inputs and data outputs to eliminate the need to
‘turnaround’ the data bus required with common IO devices.
Access to each port is accomplished through a common address
bus. Addresses for read and write addresses are latched on
alternate rising edges of the input (K) clock. Accesses to the
QDR II read and write ports are completely independent of one
another. In order to maximize data throughput, both read and
write ports are provided with DDR interfaces. Each address
location is associated with four 8-bit words (CY7C1311JV18) or
9-bit words (CY7C1911JV18) or 18-bit words (CY7C1313JV18)
or 36-bit words (CY7C1315JV18) that burst sequentially into or
out of the device. Because data is transferred into and out of the
device on every rising edge of both input clocks (K and K and C
and C), memory bandwidth is maximized while simplifying
system design by eliminating bus ‘turnarounds’.
Depth expansion is accomplished with port selects, which
enables each port to operate independently.
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
300 MHz
300
730
735
790
895
CY7C1313JV18/CY7C1315JV18
CY7C1311JV18/CY7C1911JV18
San Jose
,
CA 95134-1709
250 MHz
®
Burst Architecture
250
675
705
830
665
II SRAM 4-Word
Revised August 04, 2009
408-943-2600
MHz
Unit
mA
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Related parts for CY7C1315JV18-300BZC

CY7C1315JV18-300BZC Summary of contents

Page 1

... DDR interfaces. Each address location is associated with four 8-bit words (CY7C1311JV18) or 9-bit words (CY7C1911JV18) or 18-bit words (CY7C1313JV18) or 36-bit words (CY7C1315JV18) that burst sequentially into or out of the device. Because data is transferred into and out of the device on every rising edge of both input clocks (K and K and C ...

Page 2

... Logic Block Diagram (CY7C1911JV18 [8:0] 19 Address A (18:0) Register K CLK K Gen. DOFF V REF Control WPS Logic BWS [0] Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Write Write Write Write Address Reg Reg Reg Reg Register Control Logic Read Data Reg Reg. Reg. 16 Reg. Write Write Write ...

Page 3

... Logic Block Diagram (CY7C1313JV18 [17:0] 18 Address A (17:0) Register K CLK K Gen. DOFF V REF Control WPS Logic BWS [1:0] Logic Block Diagram (CY7C1315JV18 [35:0] 17 Address A (16:0) Register K CLK K Gen. DOFF V REF Control WPS Logic BWS [3:0] Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Write ...

Page 4

... Pin Configuration The pin configuration for CY7C1311JV18, CY7C1911JV18, CY7C1313JV18, and CY7C1315JV18 follow NC/72M DOFF V V REF DDQ TDO TCK NC/72M DOFF V V REF DDQ TDO TCK A Note 1. NC/36M, NC/72M, NC/144M and NC/288M are not connected to the die and can be tied to any voltage level. ...

Page 5

... Pin Configuration The pin configuration for CY7C1311JV18, CY7C1911JV18, CY7C1313JV18, and CY7C1315JV18 follow NC/144M NC/36M D10 D NC D11 Q10 Q11 F NC Q12 D12 G NC D13 Q13 H DOFF V V REF DDQ D14 Q14 L NC Q15 D15 D16 N NC D17 Q16 Q17 R TDO TCK ...

Page 6

... CY7C1311JV18 arrays each of 512K x 9) for CY7C1911JV18, arrays each of 256K x 18) for CY7C1313JV18 and 512K arrays each of 128K x 36) for CY7C1315JV18. Therefore, only 19 address inputs are needed to access the entire memory array of CY7C1311JV18 and CY7C1911JV18, 18 address inputs for CY7C1313JV18 and 17 address inputs for CY7C1315JV18 ...

Page 7

... Ground Ground for the Device Power Supply Power Supply Inputs for the Outputs of the Device. DDQ Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Pin Description Switching Characteristics on page 23. Switching Characteristics on page 23. output impedance are set to 0.2 x RQ, where resistor connected [x:0] , which enables the ...

Page 8

... Functional Overview The CY7C1311JV18, CY7C1911JV18, CY7C1315JV18 are synchronous pipelined Burst SRAMs with a read port and a write port. The read port is dedicated to read operations and the write port is dedicated to write operations. Data flows into the SRAM through the write port and flows out through the read port ...

Page 9

... All pending transactions (read and write) are completed before the device is deselected. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Programmable Impedance Connect an external resistor, RQ, between the ZQ pin on the SRAM and V to enable the SRAM to adjust its output driver SS impedance ...

Page 10

... MASTER BWS# (CPU CLKIN/CLKIN# or Source K ASIC) Source K# Delayed K Delayed 50ohms Truth Table The truth table for CY7C1311JV18, CY7C1911JV18, CY7C1313JV18, and CY7C1315JV18 follows. Operation K RPS WPS [8] Write Cycle: L-H H Load address on the rising edge of K; write data on two consecutive K and K rising edges. [9] ...

Page 11

... Note 10. Is based on a write cycle that was initiated in accordance with the different portions of a write cycle, as long as the setup and hold requirements are achieved. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 [2, 10] Comments ) are written into the device. [7:0] ) are written into the device. ...

Page 12

... Write Cycle Descriptions The write cycle description table for CY7C1315JV18 follows. BWS BWS BWS BWS L– – L– – L– – L– – L– – L– – Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 [2, 10] K Comments – During the data portion of a write sequence, all four bytes (D the device. L– ...

Page 13

... TDI pin on the rising edge of TCK. Data is output on the TDO pin on the falling edge of TCK. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Instruction Register Three-bit instructions are serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO pins, as shown in page 16 ...

Page 14

... Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 The shifting of data for the SAMPLE and PRELOAD phases occurs concurrently when required, that is, while the data captured is shifted out, the preloaded data is shifted in. ...

Page 15

... TAP Controller State Diagram The state diagram for the TAP controller follows. TEST-LOGIC 1 RESET 0 1 TEST-LOGIC/ 0 IDLE Note 11. The 0/1 next to each state represents the value at TMS at the rising edge of TCK. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 [11] 1 SELECT DR-SCAN 0 1 CAPTURE- SHIFT- EXIT1-DR ...

Page 16

... These characteristics pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the 13. Overshoot: V (AC) < 0.85V (Pulse width less than t IH DDQ 14. All Voltage referenced to Ground. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 0 Bypass Register Instruction Register ...

Page 17

... CS CH 16. Test conditions are specified using the load in TAP AC Test Conditions. t Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Description [16] Figure 2. TAP Timing and Test Conditions 0.9V 1.8V 50Ω ...

Page 18

... Places the bypass register between TDI and TDO. This operation does not affect SRAM operation. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Value CY7C1911JV18 CY7C1313JV18 000 000 00000110100 00000110100 1 1 Description Description CY7C1315JV18 000 Version number. SRAM. 00000110100 Allows unique identification of SRAM vendor. 1 Indicates the presence register. Bit Size ...

Page 19

... Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Bump ID Bit # Bump ID 10G 11F 58 5A 11G 10F 61 4B 11E 62 3A 10E 63 1H 10D 10C 66 3B 11D 11B 70 ...

Page 20

... DDQ DOFF Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 DLL Constraints ■ DLL uses K clock as its synchronizing input. The input has low phase jitter, which is specified as t ■ The DLL functions at frequencies down to 120 MHz. ■ If the input clock is unstable and the DLL is enabled, then the DLL may lock onto an incorrect frequency, causing unstable SRAM behavior ...

Page 21

... V REF DDQ 21. The operation current is calculated with 50% read cycle and 50% write cycle. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Current into Outputs (LOW) ........................................ 20 mA Static Discharge Voltage (MIL-STD-883, M. 3015).. > 2001V Latch-up Current ................................................... > 200 mA Operating Range Range Commercial ...

Page 22

... Unless otherwise noted, test conditions are based on signal transition time of 2V/ns, timing reference levels of 0.75V, Vref = 0.75V 250Ω, V pulse levels of 0.25V to 1.25V, and output loading of the specified I Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Test Conditions Test Conditions T = 25° MHz ...

Page 23

... These parameters are only guaranteed by design and are not tested in production KHKH 26 are specified with a load capacitance (b) of CHZ CLZ 27. At any voltage and temperature t is less than t CHZ Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 Description [24] , BWS ) BWS ) 2 3 [25] [26, 27] ...

Page 24

... Outputs are disabled (High-Z) one clock cycle after a NOP. 30. In this example, if address A2 = A1, then data Q20 = D10 and Q21 = D11. Write data is forwarded immediately as read results. This note applies to the whole diagram. Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 [28, 29, 30] WRITE READ ...

Page 25

... Not all of the speed, package and temperature ranges are available. Please contact your local sales representative or visit www.cypress.com for actual products offered. Speed (MHz) Ordering Code 300 CY7C1311JV18-300BZC CY7C1911JV18-300BZC CY7C1313JV18-300BZC CY7C1315JV18-300BZC CY7C1311JV18-300BZXC CY7C1911JV18-300BZXC CY7C1313JV18-300BZXC CY7C1315JV18-300BZXC CY7C1311JV18-300BZI CY7C1911JV18-300BZI CY7C1313JV18-300BZI CY7C1315JV18-300BZI CY7C1311JV18-300BZXI CY7C1911JV18-300BZXI ...

Page 26

... Package Diagram Figure 6. 165-Ball FBGA ( 1.40 mm), 51-85180 Document Number: 001-12562 Rev. *D CY7C1311JV18/CY7C1911JV18 CY7C1313JV18/CY7C1315JV18 51-85180 *B Page [+] Feedback ...

Page 27

... Document History Page Document Title: CY7C1311JV18/CY7C1911JV18/CY7C1313JV18/CY7C1315JV18, 18-Mbit QDR Burst Architecture Document Number: 001-12562 ORIG. OF SUBMISSION REVISION ECN CHANGE ** 808457 VKN See ECN *A 1423164 VKN/AESA See ECN *B 2189567 VKN/AESA See ECN *C 2561974 VKN/PYRS 09/04/08 *D 2748221 NJY 08/04/09 Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’ ...

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