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N25Q128A11TF840F
N25Q128A11TF840F | |
|---|---|
| Manufacturer Part Number | N25Q128A11TF840F |
| Description | IC SRL FLASH 128MB NMX 8-VDFPN |
| Manufacturer | NUMONYX |
| Series | Forté™ |
| N25Q128A11TF840F datasheets |
|
Availability: By request
International delivery:
Warranty: 60 days
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- We provide standard 60-days warranty for all parts. If warranty differs we always mention it beforehand. In case of return we cover shipping costs.
- If you still have any questions - please contact us
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Specifications of N25Q128A11TF840F | |||
|---|---|---|---|
| Format - Memory | FLASH | Memory Type | FLASH |
| Memory Size | 128M (16M x 8) | Speed | 108MHz |
| Interface | SPI, 3-Wire Serial | Voltage - Supply | 1.7 V ~ 2 V |
| Operating Temperature | -40°C ~ 85°C | Package / Case | * |
| Lead Free Status / RoHS Status | Lead free / RoHS Compliant | ||
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5.1.5
Quad Input Fast Program
The Quad Input Fast Program (QIFP) instruction makes it possible to program up to 256
bytes using 4 input pins at the same time (by changing bits from 1 to 0).
For optimized timings, it is recommended to use the QIFP instruction to program all
consecutive targeted bytes in a single sequence rather than using several QIFP sequences
each containing only a few bytes.
5.1.6
Quad Input Extended Fast Program
The Quad Input Extended Fast Program (QIEFP) instruction is an enhanced version of the
Quad Input Fast Program instruction, allowing parallel input on the 4 input pins, including
the address being sent to the device.
For optimized timings, it is recommended to use the QIEFP instruction to program all
consecutive targeted bytes in a single sequence rather than using several QIEFP
sequences each containing only a few bytes.
5.1.7
Subsector erase, sector erase and bulk erase
The page program (PP) instruction allows bits to be reset from ‘1’ to’0’. In order to do this the
bytes of memory need to be erased to all 1s (FFh).
This can be achieved as follows:
a subsector at a time, using the subsector erase (SSE) instruction (only available on
the 8 boot sectors at the bottom or top addressable area of a device with a dedicated
part number); See
a sector at a time, using the sector erase (SE) instruction;
throughout the entire memory, using the bulk erase (BE) instruction.
This starts an internal erase cycle (of duration t
be preceded by a write enable (WREN) instruction.
5.1.8
Polling during a write, program or erase cycle
A further improvement in the time to Write Status Register (WRSR), POTP, PP,
DIFP,DIEFP,QIFP, QIEFP or Erase (SSE, SE or BE) can be achieved by not waiting for the
worst case delay (tW, tPP, tSSE, tSE, or tBE). The application program can monitor if the
required internal operation is completed, by polling the dedicated register bits to establish
when the previous Write, Program or Erase cycle is complete.
The information on the memory being in progress for a Program, Erase, or Write instruction
can be checked either on the Write In Progress (WIP) bit of the Status Register or in the
Program/Erase Controller bit of the Flag Status Register.
Note:
The Program/Erase Controller bit is the opposite state of the WIP bit in the Status Register.
In the Flag Status Register additional information can be checked, as eventual
Program/Erase failures by mean of the Program or erase Error bits.
5.1.9
Active power and standby power modes
When Chip Select (S) is Low, the device is selected, and in the active power mode.
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Section 16: Ordering
information;
, t
SSE
SE
or t
). The erase instruction must
BE
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