MD2534-D2G-X-P SanDisk, MD2534-D2G-X-P Datasheet - Page 17

• Manufacturer Part Number: MD2534-D2G-X-P
• Description: IC MDOC H3 2GB FBGA
• Manufacturer: SanDisk

Specifications of MD2534-D2G-X-P

• Format - Memory: FLASH
• Memory Type: FLASH - Nand
• Memory Size: 2G (256M x 8)
• Interface: Parallel
• Voltage - Supply: 1.65 V ~ 1.95 V, 2.5 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 115-TFBGA
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Speed: -

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RSRVD
Signal
The following abbreviations are used: ST - Schmidt Trigger input. IN/PD – CMOS input with internal pull down resistor (77KΩ to 312KΩ;
135KΩ typical), which is enabled only when 8KB memory window is in use, ST/PU - Schmitt Trigger input with internal pull up resistor
(95KΩ to 261 KΩ; 149 KΩ typical).
When mDOC H3 is used as a Master device, SO is used for Serial Interface Data In, and SI is used for Serial Interface Data Out.
The 33 nF capacitor is required only for 1.8V Core and 1.8V I/O configuration. Please see section 9.5 for further details.
The RSRVD JTAG balls will only be enabled on special versions of the mDOC H3 devices that will be used for debugging severe system
problems. In order to support this feature, the JTAG balls should be brought out to a separate header or test points. The JTAG RSRVD
balls must not be connected to the JTAG scan chain that is used for the rest of the PCB. If not used they should be left floating.
NC
G1, H1, J1,
A1, A2, A9,
K1, K2, L2,
B10, , G5,
C10, D1,
D10, E9,
N9, N10,
A10, B1,
Ball No.
L9, L10,
M2, M3,
M4, M5,
M8, M9,
G6, H5,
C2, C3,
C4, C5,
C6, C7,
C8, C9,
D2, D9,
M6,M7,
H6, N2,
B2, B9,
P2, P9,
F1, F9,
M10
P10
M1
P1
N1
L1
CMOS output
Signal Type
ST/PU
ST/PU
ST/PU
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-
Data Sheet (Preliminary) Rev. 0.2
1
Mechanical
All reserved signals are not connected
internally, and if not identified in this
document then it is recommended to leave
them floating to guarantee forward
compatibility with future products. They
should not be connected to arbitrary signals,
and must not be connected to GND
Test Data In (JTAG).
Used for dedicated developer product only
Test Data Out (JTAG).
Used for dedicated developer product only
Test Mode Select (JTAG)
Used for dedicated developer product only
Test Clock (JTAG).
Used for dedicated developer product only
Not Connected.
Reserved
Description
mDOC H3 Embedded Flash Drive
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4
4
4
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92-DS-1205-10
Direction
Signal
Output
Input
Input
Input