MC33486ADH Freescale Semiconductor, MC33486ADH Datasheet
MC33486ADH
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MC33486ADH Summary of contents
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... Common Diagnostic Output • Overvoltage and Undervoltage Detection • Cross-Conduction Management * This document contains certain information on a new product. Specifications and information herein are subject to change without notice. © Freescale Semiconductor, Inc., 2005. All rights reserved. MC33486ADH/R2 V 5.0 V 5.0 V BAT 33486A ...
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... INTERNAL BLOCK DIAGRAM CHANNEL 1 Over temperature Charge Pump 2 Input Trigger Undervoltage/ Overvoltage Lockout Current Recopy Sleep Mode GND VBAT Thermal Sensor Switching Speed Adjust OUT1 Over current Driver Overload and IN2 GLS1 Cross-Conduction Management Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... Load Current Sense 3 IN1 18 IN2 4 GLS1 17 GLS2 5 – 8 OUT1 9 – – 16 OUT2 19 ST Status for Both Channels 20 WAKE TAB VBAT Analog Integrated Circuit Device Data Freescale Semiconductor TERMINAL CONNECTIONS VBAT GND 1 20 Cur IN1 3 18 GLS1 4 17 OUT1 5 16 OUT1 6 15 OUT1 7 ...
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... Value Unit - 0 BAT - 0 0.3 to 7.0 IN ± 5 Self-Limited - 40 to 150 125 150 °C/W θ 2.0 JC θ 5.0 D ±2000 ±200 240 2 2 copper heatsink (2 top side and = 1500 Ω). ZAP = 0 Ω). ZAP Analog Integrated Circuit Device Data Freescale Semiconductor °C °C ° °C ...
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... 3 STATUS Status Voltage I = 1.0 mA, Output in Fault ST Status Leakage Analog Integrated Circuit Device Data Freescale Semiconductor -40°C T 150°C unless otherwise noted. Typical values noted ≤ ≤ ≤ ≤ BAT J = 25°C under nominal conditions unless otherwise noted. J Symbol Min ...
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... FAULT T 150 SHUT T – HYST V 6 – UYST – HYST C R 3145 2960 Typ Max Unit – 1.6 V 175 190 °C °C 10 – 7.0 8.0 V 0.15 – 0.15 – V – 3700 4255 3700 4440 Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... Load = 3.0 Ω To 90% V OUT Notes 7. Time between fault occurrence and output shutdown. 8. Time between fault occurrence and gate low-side (GLS) shutdown. Analog Integrated Circuit Device Data Freescale Semiconductor -40°C T 150°C, unless otherwise noted. Typical values noted ≤ ≤ ≤ ≤ ...
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... BAT t thr A HRA 10 10% of Vbat BAT t HDON thdon 33486A 8 TIMING DIAGRAMS t HDOFF Figure 4. Outputs Slew Rate and Timing Delay IN In 90% of Vbat 90 BAT 60% of Vbat 60 BAT t thf A HFA 20 20% of Vbat BAT OUT Out thdoff Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... The device has a standby mode (Wake at low logic level) with a ultra-low consumption (10 µ A max). In operation when inputs are active, the supply current mA. Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DESCRIPTION INTRODUCTION shorted loads, overvoltage / undervoltage, and overtemperature. The device can directly interface with a microcontroller for control and diagnostic functions ...
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... This current recopy uses the well-known Sense Power 1 5000 I I copy COPY I load LOAD + Cur R Cur R MC33486 33486A Ground R gnd Logic Logic Ground gnd Figure 6. Current Recopy Principle (Figure 6, page 10) will adapt its . Of course the shift has to COPY Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... If the external low-side power MOSFETs are not used, a 470 pF capacitor in parallel with a 100 k Ω resistor can be connected at the GLSn pin to prevent the activation of the low-side MOSFET overcurrent protection. Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL INTERNAL BLOCK DESCRIPTION As V and V GS ...
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... The low-side block is packaged into D package. Junction-to-case thermal resistance is approximately 2/0 ° C/W. The junction-to-ambient thermal resistance follows the same rules as for the high-side block and is in the same range. Analog Integrated Circuit Device Data Freescale Semiconductor ): 2.0 ° C/W θJC at DS(ON ° C/W θ ...
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... Figure 9. High-Speed Positive Slew Rate (t 160.0 140.0 120.0 100.0 80.0 60.0 40.0 20.0 8.0 8 Note t is measured from 60% V HFA Figure 10. High-Speed Negative Slew Rate (t Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION to 20 BAT BAT 12 14 Vbat ( V) V (V) BAT to 40 BAT BAT ) at 25° ...
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... FUNCTIONAL DESCRIPTION FUNCTIONAL DEVICE OPERATION Figure 11. Low-Speed Mode, Oscilloscope Format Figure 12. High-Speed Mode, Oscilloscope Format 33486A 14 IN OUT Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... Figure 13. Gate Low-Side (GLS) Sourced Current Capability (High-Speed Mode Figure 14. Gate Low-Side (GLS) Sinked Current Capability (High-Speed Mode) Analog Integrated Circuit Device Data Freescale Semiconductor Vbat=9V 25°C Vbat=12V 25°C Vbat=16V 25°C 5 (V) VGLS(V) GLS Vbat=9V 25° 9.0 V 25°C vbat=12V ...
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... Figure 16. Gate Low-Side (GLS) Rise Time (Low-Speed Mode) 0.3 0.28 0.26 0.24 0.22 0.2 8.0 8 Note Curve is obtained with a load at GLS of 3.3 nF and 10 Ω at 25°C. Figure 17. Gate Low-Side Fall Time (High-Speed Mode) 33486A (V) BAT Vbat( (V) BAT (V) Vbat(V) BAT Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... Note Curve is obtained with a load at GLS of 3.3 nF and 10 Ω at 25°C. Figure 18. Gate Low-Side Fall Time (Low-Speed Mode) Analog Integrated Circuit Device Data Freescale Semiconductor (V) Vbat(V) BAT FUNCTIONAL DESCRIPTION FUNCTIONAL DEVICE OPERATION 16 18 33486A ...
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... High Impedance High Impedance Low Low Low I lim I lim I LIM Low Low Low High Impedance High Impedance High Impedance High Impedance High Impedance High Impedance > 4 Low Low Low Low Low Low Low Low Low Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... I (A) I(A) OUT Figure 24. C versus I Overtemperature R OUT for BAT Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL PERFORMANCE 4200 4100 4000 3900 3800 3700 3600 3500 3400 3300 100 150 3200 0 0 Figure 25. C Temper 25°C Temperature = 25° ...
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... FUNCTIONAL DESCRIPTION FUNCTIONAL DEVICE OPERATION - 100 Tem perature(°C) Temperature (°C) Figure 27. Continuous Current versus Temperature with R = 27.5°C/W θJA Figure 28. 33486A 20 150 200 Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... INn of the output that experienced the fault must be reset in order to recover the normal operation mode. Figure 22, Overload on Low-Side OUT2 are both put in high impedance. IN2 must be reset to recover normal mode. Analog Integrated Circuit Device Data Freescale Semiconductor OPERATIONAL MODES IN2 WAKE OUT1 ...
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... TYPICAL APPLICATIONS 5.0 V MCU GND 33486A 22 TYPICAL APPLICATIONS V 5.0 V BAT 33486A 10 k Ω VBAT ST OUT2 IN1 GLS2 IN2 WAKE OUT1 Cur R GLS1 1.0 k Ω GND Figure 29. 33486A Typical Application Diagram 470 µF Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... For the most current revision of the package, visit specific device related to the data sheet. Analog Integrated Circuit Device Data Freescale Semiconductor PACKAGING PACKAGING DIMENSIONS www.freescale.com and do a keyword search using the 98A number for the DW SUFFIX 20-TERMINAL HSOP 98ASH70702A ISSUE B PACKAGING ...
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... PACKAGING PACKAGING DIMENSIONS (CONTINUED) 33486A 24 PACKAGING DIMENSIONS (CONTINUED) DW SUFFIX 20-TERMINAL HSOP 98ASH70702A ISSUE B Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... Revision Date Description of Changes 12/2005 Updated to Freescale Format 2.0 Added Thermal Addendum Analog Integrated Circuit Device Data Freescale Semiconductor REVISION HISTORY REVISION HISTORY 33486A 25 ...
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... Note For package dimensions, refer to the 33486A device datasheet. 1.0 1.0 0.2 0.2 * All measurements are in millimeters Soldermast openings Thermal vias 20 Terminal HSOP-EP connected to top 1.27 mm Pitch buried plane 16 11.0 mm Body Attachment per JESD51-5 Analog Integrated Circuit Device Data Freescale Semiconductor ...
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... NC VBAT 33486A Terminal Connections 20-Terminal HSOP 1.27 mm Pitch 16 11.0 mm Body 12 6.9 mm Exposed Pad Device on Thermal Test Board Analog Integrated Circuit Device Data Freescale Semiconductor WAKE ST IN2 GLS2 OUT2 OUT2 OUT2 OUT2 NC NC Figure 31. Thermal Test Board ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 1.0) ...
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... R is the thermal resistance between die junction and θ JA ambient air the thermal resistance between die junction and θJS the reference location on the board surface near a center lead of the package (see Figure 31). Analog Integrated Circuit Device Data Freescale Semiconductor 7.0 10 6.0 ...
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... Figure 32. Device on Thermal Test Board R 100 10 1 0.1 1.00E-03 1.00E-02 Figure 33. Transient Thermal Resistance R Device on Thermal Test Board Area A = 600 (mm Analog Integrated Circuit Device Data Freescale Semiconductor x R θJA11 R θJA22 θJA12 θJA21 0 300 Heat spreading area A [mm²] θJA 1.00E-01 1.00E+00 1 ...
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... Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer ...