PHOTOCOUPLER TRANS-OUT 4-SMD

TLP181

Manufacturer Part NumberTLP181
DescriptionPHOTOCOUPLER TRANS-OUT 4-SMD
ManufacturerToshiba
TLP181 datasheets
 


Specifications of TLP181

Number Of Channels1Input TypeDC
Voltage - Isolation3750VrmsCurrent Transfer Ratio (min)50% @ 5mA
Current Transfer Ratio (max)600% @ 5mAVoltage - Output80V
Current - Output / Channel50mACurrent - Dc Forward (if)50mA
Vce Saturation (max)400mVOutput TypeTransistor
Mounting TypeSurface MountPackage / Case4-SMD
Lead Free Status / RoHS StatusContains lead / RoHS non-compliant  
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9
Device Degradation
GaAs LED Projected Light Output Degradation Data
1
Test conditions: I
= 50 mA, Ta = 40°C
F
140
120
100
80
60
40
20
0
1
10
100
1000
Test time (h)
Test conditions: I
= 10 mA, Ta = 40°C
F
140
120
100
80
60
40
20
0
1
10
100
1000
Test time (h)
GaAs LED Projected Operating Life Data
1
Failure criteria light output degradation Δ P O < –50%
10000000
I
= 10 mA
F
1000000
I
= 20 mA
F
I
= 30 mA
F
100000
I
= 40 mA
F
I
= 50 mA
F
10000
1000
100
2.0
3.0
227
150
100
85
60
25
0
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are shown as
reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
140
120
100
X
80
60
40
X-3σ
20
0
10000
100000
1
X
X-3σ
10000
100000
Failure criteria light output degradation Δ P O < –30%
I
= 10 mA
F
10000000
I
= 20 mA
F
I
= 30 mA
F
1000000
I
= 40 mA
F
I
= 10 mA
F
I
= 50 mA
F
100000
I
= 20 mA
F
I
= 30 mA
F
I
= 40 mA
F
10000
I
= 50 mA
F
Projected F50%
1000
operating life
Projected F0.1%
operating life
100
4.0
5.0
2.0
-3
1 / K (x10
)
–30
–50
–73
227
150
Ambient Temperature (°C)
60
Test conditions: I
= 20 mA, Ta = 40°C
F
X
X-3σ
10
100
1000
10000
100000
Test time (h)
I
= 10 mA
F
I
= 20 mA
F
I
= 30 mA
F
I
= 40 mA
F
I
= 50 mA
F
Projected F50%
operating life
Projected F0.1%
operating life
3.0
4.0
5.0
1 / K (x10
100
85
60
25
0
–30
–50
–73
Ambient Temperature (°C)
-3
)