MT18VDDF12872G-335D3 Micron Technology Inc, MT18VDDF12872G-335D3 Datasheet - Page 22

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MT18VDDF12872G-335D3

Manufacturer Part Number
MT18VDDF12872G-335D3
Description
MODULE DDR SDRAM 1GB 184-DIMM
Manufacturer
Micron Technology Inc
Datasheet

Specifications of MT18VDDF12872G-335D3

Memory Type
DDR SDRAM
Memory Size
1GB
Speed
167MHz
Package / Case
184-DIMM
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
557-1113
pdf: 09005aef8074e85b, source: 09005aef8072fe49
DDF18C64_128x72G.fm - Rev. C 11/04 EN
22. The valid data window is derived by achieving
23. Each byte lane has a corresponding DQS.
24. This limit is actually a nominal value and does not
25. To maintain a valid level, the transitioning edge of
once every 70.3µs; burst refreshing or posting by
the DRAM controller greater than eight refresh
cycles is not allowed.
other specifications:
(
in direct porportion to the clock duty cycle and a
practical data valid window can be derived. The
clock is allowed a maximum duty cycle variation
of 45/55, beyond which functionality is uncertain.
Figure 9, Derating Data Valid Window (
t
and 45/55.
result in a fail value. CKE is HIGH during
REFRESH command period (
CKE is LOW (i.e., during standby).
the input must:
DQSQ), shows duty cycles ranging between 50/50
a. Sustain a constant slew rate from the current
b. Reach at least the target AC level.
c. After the AC target level is reached, continue to
t
QH =
AC level through to the target AC level, V
or V
3.8
3.6
3.4
3.2
3.0
2.8
2.6
2.4
2.2
2.0
1.8
t
IH
HP -
(AC).
50/50
3.750
2.500
3.400
t
QHS). The data valid window derates
N/A
N/A
49.5/50.5
3.700
-26A/-265 @
-202 @
-26A/-265 @
-202 @
-335 @
t
3.350
2.463
HP (
t
t
t
CK = 10ns
CK = 8ns
CK = 6ns
t
Figure 9: Derating Data Valid Window
CK/2),
3.650
49/51
t
t
CK = 10ns
CK = 7.5ns
2.425
3.300
t
RFC [MIN]) else
t
DQSQ, and
48.5/52.5
3.600
2.388
3.250
IL
t
QH -
(AC)
(
48/52
t
3.550
t
QH
QH -
2.350
3.200
Clock Duty Cycle
22
t
DQSQ)
47.5/53.5
3.500
26. JEDEC specifies CK and CK# input slew rate must
27. DQ and DM input slew rates must not deviate
28. V
29. The clock is allowed up to ±150ps of jitter. Each
30.
31. READs and WRITEs with auto precharge are not
2.313
3.150
be 1V/ns (2V/ns differentially).
from DQS by more than 10 percent. If the DQ/
DM/DQS slew rate is less than 0.5V/ns, timing
must be derated: 50ps must be added to
t
slew rate exceeds 4V/ns, functionality is uncer-
tain. For -335, slew rates must be
335, slew rates must be 0.5 V/ns.
not active while any bank is active.
timing parameter is allowed to vary by the same
amount.
t
minimum actually applied to the device CK and
CK# inputs, collectively during bank active.
allowed to be issued until
fied prior to the internal precharge command
being issued.
DH for each 100mv/ns reduction in slew rate. If
HP min is the lesser of
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD
184-PIN DDR SDRAM RDIMM
maintain at least the target DC level, V
or V
3.450
47/53
must not vary more than 4 percent if CKE is
512MB, 1GB (x72, ECC, SR)
2.275
3.100
IH
(DC).
46.5/54.5
3.400
2.238
3.050
3.350
46/54
2.200
3.000
©2004 Micron Technology, Inc. All rights reserved.
t
t
RAS (MIN) can be satis-
CL minimum and
45.5/55.5
3.300
2.163
2.950
0.5 V/ns. For -
3.250
45/55
2.125
2.900
t
DS and
IL
(DC)
t
CH

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