0402ZD104KAT2A AVX Corporation, 0402ZD104KAT2A Datasheet - Page 2

CAP CERM .1UF 10% 10V X5R 0402

0402ZD104KAT2A

Manufacturer Part Number
0402ZD104KAT2A
Description
CAP CERM .1UF 10% 10V X5R 0402
Manufacturer
AVX Corporation
Series
0402r

Specifications of 0402ZD104KAT2A

Capacitance
0.1µF
Package / Case
0402 (1005 Metric)
Voltage - Rated
10V
Tolerance
±10%
Temperature Coefficient
X5R
Mounting Type
Surface Mount, MLCC
Operating Temperature
-55°C ~ 85°C
Applications
General Purpose
Size / Dimension
0.039" L x 0.020" W (1.00mm x 0.50mm)
Thickness
0.56mm Max
Tolerance (+ Or -)
10%
Voltage
10VDC
Temp Coeff (dielectric)
X5R
Operating Temp Range
-55C to 85C
Mounting Style
Surface Mount
Construction
SMT Chip
Case Style
Ceramic Chip
Failure Rate
Not Required
Wire Form
Not Required
Product Length (mm)
1mm
Product Depth (mm)
0.5mm
Product Height (mm)
0.56mm
Product Diameter (mm)
Not Requiredmm
Dielectric Characteristic
X5R
Capacitance Tolerance
± 10%
Voltage Rating
10VDC
Capacitor Case Style
0402
No. Of Pins
2
Capacitor Mounting
SMD
Rohs Compliant
Yes
Case Size
0402
Dielectric Strength
No breakdown or visual defects
Dissipation Factor
5 %
Dissipation Factor, Test Condition
(Max.)
Insulation Resistance
100000 Megohms
Length
0.040 in. ±0.004 in.
Material, Element
Ceramic
Package Type
7 in. Reel
Temperature, Operating, Maximum
+125 °C
Temperature, Operating, Minimum
-55 °C
Termination
SMT
Voltage, Rating
10 VDC
Width
0.020 in. ±0.004 in.
Operating Temperature Range
- 55 C to + 85 C
Temperature Coefficient / Code
X5R
Product
General Type MLCCs
Dimensions
0.5 mm W x 1 mm L x 0.56 mm H
Dissipation Factor Df
5
Termination Style
SMD/SMT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Ratings
-
Lead Spacing
-
Lead Free Status / Rohs Status
RoHS Compliant part
Other names
478-1129-2
X5R Dielectric
Specifications and Test Methods
Resistance to
Resistance to
Operating Temperature Range
Solder Heat
Load Life
Humidity
Stresses
Thermal
Flexure
Shock
Load
Insulation Resistance
Dielectric Strength
Dissipation Factor
Parameter/Test
Capacitance
Solderability
Capacitance
Capacitance
Capacitance
Capacitance
Capacitance
Appearance
Appearance
Appearance
Appearance
Appearance
Resistance
Resistance
Resistance
Resistance
Resistance
Dissipation
Dissipation
Dissipation
Dissipation
Dissipation
Insulation
Insulation
Insulation
Insulation
Insulation
Dielectric
Dielectric
Dielectric
Dielectric
Variation
Variation
Strength
Variation
Strength
Variation
Strength
Variation
Strength
Factor
Factor
Factor
Factor
Factor
No defects, <25% leaching of either end terminal
≥ 95% of each terminal should be covered
≤ 12.5% Max. for 16V DC rating and lower
No breakdown or visual defects
≥ Initial Value x 0.3 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
≤ Initial Value x 2.0 (See Above)
Meets Initial Values (As Above)
≤ Initial Value x 2.0 (See Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Contact Factory for DF by PN
X5R Specification Limits
≤ 2.5% for ≥ 50V DC rating
10,000MΩ or 500MΩ - μF,
Within specified tolerance
≤ 3.0% for 25V DC rating
≥ Initial Value x 0.3
No visual defects
whichever is less
with fresh solder
No visual defects
-55ºC to +85ºC
No visual defects
No defects
≤ ±12.5%
≤ ±12.5%
≤ ±12%
≤ ±7.5%
≤ ±7.5%
1-5 seconds, w/charge and discharge current
seconds. Store at room temperature for 24 ± 2
Charge device with 300% of rated voltage for
hours before measuring electrical properties.
Dip device in eutectic solder at 260ºC for 60
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +85ºC ± 2º
Step 4: Room Temp
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
test chamber set at 85ºC ± 2ºC for 1000 hours
Dip device in eutectic solder at 230 ± 5ºC
85% ± 5% relative humidity for 1000 hours
Store in a test chamber set at 85ºC ± 2ºC/
specification part numbers that are tested at
(+48, -0). Note: Contact factory for *optional
Remove from chamber and stabilize at
Charge device with 1.5X rated voltage in
Remove from test chamber and stabilize
120 ± 5 secs @ room temp/humidity
Charge device with rated voltage for
For Cap > 10 μF, 0.5Vrms @ 120Hz
at room temperature for 24 ± 2 hours
(+48, -0) with rated voltage applied.
room temperature and humidity for
24 ± 2 hours before measuring.
Temperature Cycle Chamber
Measuring Conditions
Voltage: 1.0Vrms ± .2V
Test Time: 30 seconds
limited to 50 mA (max)
Freq.: 1.0 kHz ± 10%
for 5.0 ± 0.5 seconds
< 1.5X rated voltage.
before measuring.
Deflection: 2mm
90 mm
1mm/sec
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
25

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