DSPIC33FJ32MC304-E/PT Microchip Technology, DSPIC33FJ32MC304-E/PT Datasheet - Page 6

IC DSPIC MCU/DSP 32K 44-TQFP

DSPIC33FJ32MC304-E/PT

Manufacturer Part Number
DSPIC33FJ32MC304-E/PT
Description
IC DSPIC MCU/DSP 32K 44-TQFP
Manufacturer
Microchip Technology
Series
dsPIC™ 33Fr

Specifications of DSPIC33FJ32MC304-E/PT

Program Memory Type
FLASH
Program Memory Size
32KB (32K x 8)
Package / Case
44-TQFP, 44-VQFP
Core Processor
dsPIC
Core Size
16-Bit
Speed
40 MIPs
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, DMA, Motor Control PWM, QEI, POR, PWM, WDT
Number Of I /o
35
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 9x10b/12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Product
DSCs
Data Bus Width
16 bit
Processor Series
DSPIC33F
Core
dsPIC
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
35
Data Ram Size
4 KB
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
3rd Party Development Tools
52713-733, 52714-737, 53276-922, EWDSPIC
Development Tools By Supplier
PG164130, DV164035, DV244005, DV164005, PG164120, DM240001, DM240002, DM330011, DM330021, MA330018
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
DV164033 - KIT START EXPLORER 16 MPLAB ICD2DM240001 - BOARD DEMO PIC24/DSPIC33/PIC32
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
DSPIC33FJ32MC304-E/PT
Manufacturer:
Microchip
Quantity:
225
Part Number:
DSPIC33FJ32MC304-E/PT
Manufacturer:
Microchip Technology
Quantity:
10 000
12. Module: UART
13. Module: Comparator
14. Module: Internal Voltage Regulator
DS80442F-page 6
When the UART is operating in 8-bit mode
(PDSEL = 0x) and using the IrDA encoder/decoder
(IREN = 1), the module incorrectly transmits a data
payload of 80h as 00h.
Work around
None.
Affected Silicon Revisions
If CMCON<CxOUTEN> bit is set and the
comparator
disabled, the remappable comparator output pins,
C1OUT and C2OUT, cannot be used as general
purpose I/O pins.
Work around
When the comparator module is disabled the
CMCON<CxOUTEN> bit should be reset so that
the remappable comparator output pins C1OUT
and C2OUT are not driven onto the output pad.
Affected Silicon Revisions
When the VREGS bit (RCON<8>) is set to a logic
‘0’, the device may reset and a higher Sleep
current may be observed.
Work around
Ensure VREGS bit (RCON<8>) is set to a logic ‘1’
for device Sleep mode operation.
Affected Silicon Revisions
A1
A1
A1
X
X
X
A2
A2
A2
X
X
X
module
A3
A3
A3
X
X
X
A4
A4
A4
X
X
X
CMCON<CxEN>
bit
is
15. Module: PSV Operations
16. Module: ECAN
An address error trap occurs in certain addressing
modes when accessing the first four bytes of an
PSV page. This only occurs when using the
following addressing modes:
• MOV.D
• Register Indirect Addressing (Word or Byte
Work around
Do not perform PSV accesses to any of the first
four bytes using the above addressing modes. For
applications using the C language, MPLAB C30
version 3.11 or higher, provides the following
command-line switch that implements a work
around for the erratum.
-merrata=psv_trap
Refer to the readme.txt file in the MPLAB C30
v3.11 tool suite for further details.
Affected Silicon Revisions
The WAKIF bit in the CxINTF register cannot be
cleared by software instruction after the device is
interrupted from Sleep due to activity on the CAN
bus.
When the device wakes up from Sleep due to CAN
bus activity, the ECAN module is placed in
operational mode. The ECAN Event interrupt
occurs due to the WAKIF flag. Trying to clear the
flag in the Interrupt Service Routine (ISR) may not
clear the flag. The WAKIF bit being set will not
cause
execution.
Work around
Although the WAKIF bit does not clear, the device
Sleep and ECAN Wake function continue to work
as expected. If the ECAN event is enabled, the
CPU will enter the Interrupt Service Routine due to
the WAKIF flag getting set. The application can
maintain a secondary flag, which tracks the device
Sleep and Wake events.
Affected Silicon Revisions
A1
A1
mode) with pre/post-decrement
X
X
A2
A2
X
X
repetitive
A3
A3
X
X
© 2010 Microchip Technology Inc.
A4
A4
Interrupt
X
X
Service
Routine

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