AT32AP7001-ALUT Atmel, AT32AP7001-ALUT Datasheet - Page 776

IC MCU 32BIT AVR32 208-LQFP

AT32AP7001-ALUT

Manufacturer Part Number
AT32AP7001-ALUT
Description
IC MCU 32BIT AVR32 208-LQFP
Manufacturer
Atmel
Series
AVR®32 AP7r
Datasheets

Specifications of AT32AP7001-ALUT

Core Processor
AVR
Core Size
32-Bit
Speed
150MHz
Connectivity
EBI/EMI, I²C, MMC, PS2, SPI, SSC, UART/USART, USB
Peripherals
AC'97, DMA, I²C, POR, PWM, WDT
Number Of I /o
90
Program Memory Type
ROMless
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
D/A 2x16b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
208-LQFP
Data Bus Width
32 bit
Data Ram Size
32 KB
Interface Type
EBI, ISI, MCI, PS2, SPI, TWI, USB
Maximum Clock Frequency
150 MHz
Number Of Programmable I/os
90
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Dac
16 bit, 1 Channel
Package
208PQFP
Device Core
AVR32
Family Name
AT32
Maximum Speed
150 MHz
Operating Supply Voltage
1.8 V
For Use With
ATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMRATNGW100 - KIT AVR32 NETWORK GATEWAYATSTK1000 - KIT STARTER FOR AVR32AP7000
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Program Memory Size
-
Lead Free Status / Rohs Status
 Details

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37. JTAG and Boundary Scan
37.1
37.2
32015G–AVR32–09/09
Features
Overview
Rev.: 1.0.0.0
Figure 37-1 on page 777
troller is a state machine controlled by the TCK and TMS signals. The TAP Controller selects
either the JTAG Instruction Register or one of several Data Registers as the scan chain (shift
register) between the TDI-input and TDO-output. The Instruction Register holds JTAG instruc-
tions controlling the behavior of a Data Register.
The Device Identification Register, Bypass Register, and the Boundary-Scan Chain are the Data
Registers used for board-level testing. The Reset Register can be used to keep the device reset
during test or programming.
The Service Access Bus (SAB) interface contains address and data registers for the Service
Access Bus, which gives access to on-chip debug, programming, and other functions in the
device. The SAB offers several modes of access to the address and data registers, as dis-
cussed in
”JTAG Instruction Summary” on page 782
to the description in this document.
IEEE1149.1 compliant JTAG Interface
Boundary-Scan Chain for board-level testing
Direct memory access and programming capabilities through JTAG interface
On-Chip Debug access in compliance with IEEE-ISTO 5001-2003 (Nexus 2.0)
”Service Access Bus” on page
shows how the JTAG is connected in an AVR32 device. The TAP Con-
780.
lists the supported JTAG instructions, with references
AT32AP7001
776

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