ST62T25CB6 STMicroelectronics, ST62T25CB6 Datasheet - Page 78

IC MCU 8BIT OTP 4K 28 PDIP

ST62T25CB6

Manufacturer Part Number
ST62T25CB6
Description
IC MCU 8BIT OTP 4K 28 PDIP
Manufacturer
STMicroelectronics
Series
ST6r
Datasheets

Specifications of ST62T25CB6

Core Processor
ST6
Core Size
8-Bit
Speed
8MHz
Peripherals
LVD, POR, WDT
Number Of I /o
20
Program Memory Size
4KB (4K x 8)
Program Memory Type
OTP
Ram Size
64 x 8
Voltage - Supply (vcc/vdd)
3 V ~ 6 V
Data Converters
A/D 16x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
28-DIP (0.600", 15.24mm)
Processor Series
ST62T2x
Core
ST6
Data Bus Width
8 bit
Data Ram Size
64 B
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
20
Number Of Timers
1
Operating Supply Voltage
3 V to 6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
Development Tools By Supplier
ST62GP-EMU2, ST62E2XC-EPB/110, ST62E6XC-EPB/US, ST622XC-KIT/110, STREALIZER-II
Minimum Operating Temperature
- 40 C
On-chip Adc
16-ch x 8-bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Connectivity
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
497-2100-5

Available stocks

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0
ST6215CM-Auto ST6225CM-Auto
11.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
11.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 µF and 0.1 µF decoupling capacitors on the power supply lines are proposed as a good price vs.
Figure 56. EMC Recommended Star Network Power Supply Connection
78/100
1
Symbol
EMC performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC rec-
ommendations are given in other sections (I/Os, RESET, OSCx pin characteristics).
V
V
FESD
FFTB
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
POWER
SUPPLY
SOURCE
Parameter
V
DD
DD
and V
ST6
DIGITAL NOISE
FILTERING
(close to the MCU)
DD
pins
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
DD
DD
10 µF
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
0.1 µF
Conditions
A
A
+25°C, f
+25°C, f
V
V
DD
SS
OSC
OSC
8MHz
8MHz
ST62XX
2)
Neg
-2.5
-2
DD
1)
and V
Pos
2
3
SS
1)
through
Unit
kV

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