ST72F325K4T6 STMicroelectronics, ST72F325K4T6 Datasheet - Page 158

MCU 8BIT 16KB FLASH/ROM 32-LQFP

ST72F325K4T6

Manufacturer Part Number
ST72F325K4T6
Description
MCU 8BIT 16KB FLASH/ROM 32-LQFP
Manufacturer
STMicroelectronics
Series
ST7r
Datasheet

Specifications of ST72F325K4T6

Core Processor
ST7
Core Size
8-Bit
Speed
8MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
24
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Ram Size
512 x 8
Voltage - Supply (vcc/vdd)
3.8 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
32-LQFP
Processor Series
ST72F3x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
512 B
Interface Type
I2C, SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
48
Number Of Timers
2
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Development Tools By Supplier
ST7232X-EVAL, ST7232X-SK/RAIS, ST72325-D/RAIS, ST7MDT20-DVP3, ST7MDT20J-EMU3, ST7MDT20M-EMU3, STX-RLINK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 16 Channel
For Use With
497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
497-5605

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EMC CHARACTERISTICS (Cont’d)
12.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity. For more details, re-
fer to the application note AN1181.
Absolute Maximum Ratings
Notes:
1. Data based on characterization results, not tested in production.
12.7.3.2 Static Latch-Up
Electrical Sensitivities
158/197
V
V
LU: 2 complementary static tests are required
on 6 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
Symbol
Symbol
ESD(HBM)
ESD(MM)
LU
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Machine Model)
Static latch-up class
Parameter
Ratings
T
T
T
conforming to JESD 78
A
A
A
=+25°C
=+25°C
=+125°C
12.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). Two models can be simulated: Human
Body Model and Machine Model. This test con-
forms to the JESD22-A114A/A115A standard.
supply pin) and a current injection (applied to
each input, output and configurable I/O pin) are
performed on each sample. This test conforms
to the EIA/JESD 78 IC latch-up standard.
Conditions
Conditions
Maximum value
2000
200
II level A
Class
1)
1)
Unit
V

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