LPC3152FET208,551 NXP Semiconductors, LPC3152FET208,551 Datasheet - Page 82

• Manufacturer Part Number: LPC3152FET208,551
• Description: IC ARM9 MCU USB OTG 208TFBGA
• Manufacturer: NXP Semiconductors
• Series: LPC3000r

Specifications of LPC3152FET208,551

• Package / Case: 208-TFBGA
• Core Processor: ARM9
• Core Size: 32-Bit
• Speed: 180MHz
• Connectivity: EBI/EMI, I²C, IrDA, MMC, PCM, SPI, UART/USART, USB OTG
• Peripherals: DMA, I²S, LCD, PWM, WDT
• Number Of I /o: 10
• Program Memory Type: ROMless
• Ram Size: 192K x 8
• Voltage - Supply (vcc/vdd): 1.1 V ~ 3.6 V
• Data Converters: A/D 3x10b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Processor Series: LPC31
• Core: ARM926EJS
• Data Bus Width: 32 bit
• Data Ram Size: 192 KB
• Interface Type: I2C, I2S, SPI, UART
• Maximum Clock Frequency: 180 MHz
• Number Of Timers: 5
• Operating Supply Voltage: 1.2 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: OM11029
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Program Memory Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 935287561551

NXP Semiconductors
14. Abbreviations
LPC3152_3154
Preliminary data sheet
Table 38:
Acronym
ADC
ADC10B
AES
AVC
BIU
CBC
CD
CGU
DFU
DMA
DRM
ECC
FIR
HP
IOCONFIG
ROM
IrDA
JTAG
ISRAM
JTAG
LCD
LDO
LNA
MMU
NTC
OTP
PCM
PGA
PHY
PLL
PSU
PWM
RNG
SDC
SHA1
SIR
SPI
SSI
SysCReg
Abbreviations
All information provided in this document is subject to legal disclaimers.
Description
Analog-to-Digital Converter
10 Bit Analogue to Digital Converter
Advanced Encryption Standard
Analog Volume Control
Bus Interface Unit
Cipher Block Chaining
Compact Disk
Clock Generation Unit
Device Firmware Upgrade
Direct Memory Access Controller
Digital Rights Management
Error Correction Code
Finite Input Response
Headphones
Input Output Configuration
Read Only Memory
Infrared Data Association
Joint Test Action Group
Internal Static RAM Memory
Joint Test Action Group
Liquid Crystal Display
Low Drop voltage Output regulator
Low-Noise Amplifier
Memory Management Unit
Negative Temperature Coefficient
One-Time Programmable Memory
Pulse Code Modulation
Programmable Gain Amplifier
Physical Layer
Phase Locked Loop
Power Supply Unit
Pulse Width Modulation
Random Number Generator
Secure Hash Algorithm 1
Serial IrDA
Serial Peripheral Interface
Serial Synchronous Interface
System Control Registers
Rev. 0.12 — 27 May 2010
LPC3152/3154
© NXP B.V. 2010. All rights reserved.
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