ST72F264G2B6 STMicroelectronics, ST72F264G2B6 Datasheet - Page 141
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ST72F264G2B6
Manufacturer Part Number
ST72F264G2B6
Description
MCU 8-BIT 8K FLASH 32-SDIP
Manufacturer
STMicroelectronics
Series
ST7r
Specifications of ST72F264G2B6
Mfg Application Notes
ST7 Checksum Capability, AN1070 App Note
Core Processor
ST7
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
22
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 6x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
32-SDIP (0.400", 10.16mm)
Processor Series
ST72F2x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
256 B
Interface Type
I2C, SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
22
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
Development Tools By Supplier
ST7F264-IND/USB, ST72F34X-SK/RAIS, ST7MDT10-DVP3, ST7MDT10-EMU3, STX-RLINK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 6 Channel
For Use With
497-6423 - BOARD EVAL BASED ON ST72264G1497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Other names
497-5570
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
ST72F264G2B6
Manufacturer:
ST
Quantity:
10
Company:
Part Number:
ST72F264G2B6
Manufacturer:
NEC
Quantity:
6 097
Part Number:
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Manufacturer:
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20 000
13.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
13.7.1 Functional EMS (Electro Magnetic
Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
■
■
A device reset allows normal operations to be re-
sumed. The test results are given in the table be-
low based on the EMS levels and classes defined
in application note AN1709.
13.7.1.1 Designing hardened software to avoid
noise problems
EMC characterization and optimization are per-
formed at component level with a typical applica-
Figure 75. EMC Recommended power supply connection
1. The suggested 10µF and 0.1µF decoupling capacitors on the power supply lines are proposed as a good price vs. EMC
performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC recommen-
dations are given in AN1709.
Symbol
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
V
V
FESD
FFTB
POWER
SUPPLY
SOURCE
Voltage limits to be applied on any I/O pin to induce a
functional disturbance
Fast transient voltage burst limits to be applied
through 100pF on V
tional disturbance
V
DD
DD
Parameter
DD
and V
and V
ST7
DIGITAL NOISE
FILTERING
DD
pins to induce a func-
SS
through
10µF
0.1µF
tion environment and simplified MCU software. It
should be noted that good EMC performance is
highly dependent on the user application and the
software in particular.
Therefore it is recommended that the user applies
EMC software optimization and prequalification
tests in relation with the EMC level requested for
his application.
Software recommendations:
The software flowchart must include the manage-
ment of runaway conditions such as:
– Corrupted program counter
– Unexpected reset
– Critical Data corruption (control registers...)
Prequalification trials:
Most of the common failures (unexpected reset
and program counter corruption) can be repro-
duced by manually forcing a low state on the RE-
SET pin or the Oscillator pins for 1 second.
To complete these trials, ESD stress can be ap-
plied directly on the device, over the range of
specification values. When unexpected behaviour
is detected, the software can be hardened to pre-
vent unrecoverable errors occurring (see applica-
tion note AN1015).
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
ST72260Gx, ST72262Gx, ST72264Gx
DD
DD
1)
V
V
=5V, T
=5V, T
DD
SS
A
A
=+25°C, f
=+25°C, f
ST72XXX
Conditions
OSC
OSC
=8MHz
=8MHz
141/172
Level/
Class
2B
2B