MPC564MZP66 Freescale Semiconductor, MPC564MZP66 Datasheet - Page 107

• Manufacturer Part Number: MPC564MZP66
• Description: IC MCU 512K FLASH 66MHZ 388-BGA
• Manufacturer: Freescale Semiconductor
• Series: MPC5xxr

Specifications of MPC564MZP66

• Core Processor: PowerPC
• Core Size: 32-Bit
• Speed: 66MHz
• Connectivity: CAN, EBI/EMI, SCI, SPI, UART/USART
• Peripherals: POR, PWM, WDT
• Number Of I /o: 56
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Voltage - Supply (vcc/vdd): 2.5 V ~ 2.7 V
• Data Converters: A/D 32x10b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 388-BGA
• For Use With: MPC564EVB - KIT EVAL FOR MPC561/562/563/564
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -

Freescale Semiconductor
TMS / EVTI
TDI / DSDI / MDI0
TCK / DSCK / MCKI
TDO / DSDO / MDO0
JCOMP / RSTI
Signal Name
Table 2-1. MPC561/MPC563 Signal Descriptions (continued)
Signals
No. of
1
1
1
1
1
MPC561/MPC563 Reference Manual, Rev. 1.2
Type
O
O
O
I
I
I
I
I
I
I
I
I
I
TMS unless the
Nexus (READI)
port is enabled,
then EVTI.
See
DSDI unless the
Nexus (READI)
port (MDI0) or
JTAG mode
(TDI) is enabled.
See
DSCK unless
the Nexus
(READI) port
(MCKI) or JTAG
mode (TCK) is
enabled.
See
DSDO unless
the Nexus
(READI) port
(MDO0) or JTAG
mode (TDO) is
enabled.
See
See
Function after
Section
Section
Section
Section
Section
Reset
JTAG/BDM/READI
1
2.5.
2.5.
2.5.
2.5.
2.5.
Test Mode Select. This input controls test mode operations
for on-board test logic (JTAG).
EVTI. Event in (EVTI) is level sensitive when configured for
breakpoint generation, otherwise it is edge sensitive.
Test Data In. This input is used for serial test instructions
and test data for on-board test logic (JTAG).
Development Serial Data Input. This input signal is the data
in for the debug port interface. See
“Development
Message Data In. MDI0 is a Nexus input signal used for
downloading configuration information, writes to user
resources, and so forth. Internal latching of MDI occurs on
the rising edge of MCKI.
Test Clock. This input provides a clock for on-board test logic
(JTAG).
Development Serial Clock. This input signal is the clock for
the debug port interface. See
Support,” for details.
Message Clock In. This input line is the input clock to the
READI module for the Nexus message clock input.
Test Data Out. This output is used for serial test instructions
and test data for on-board test logic (JTAG).
Development Serial Data Output. This output signal is the
data-out line of the debug port interface. See
“Development
READI Message Data Out. Message data out: MDO0 is an
output signal used for uploading OTM, BTM, DTM, and
read/write accesses. External latching of MDO occurs on
rising edge of MCKO. Eight MDO signals are implemented.
JTAG Compliancy. This signal enables the IEEE1149.1
JTAG compliant circuitry in the MPC561/MPC563.
0 JTAG disabled
1 JTAG enabled
RSTI. Reset input for the Nexus port.
Support,” for details.
Support,” for details.
Description
Chapter 23, “Development
Chapter 23,
Signal Descriptions
Chapter 23,
2-9