OP470GPZ Analog Devices Inc, OP470GPZ Datasheet - Page 11

• Manufacturer Part Number: OP470GPZ
• Description: IC OPAMP GP 6MHZ QUAD LN 14DIP
• Manufacturer: Analog Devices Inc

Specifications of OP470GPZ

• Slew Rate: 2 V/µs
• Amplifier Type: General Purpose
• Number Of Circuits: 4
• Gain Bandwidth Product: 6MHz
• Current - Input Bias: 25nA
• Voltage - Input Offset: 400µV
• Current - Supply: 9mA
• Voltage - Supply, Single/dual (±): 9 V ~ 36 V, ±4.5 V ~ 18 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Through Hole
• Package / Case: 14-DIP (0.300", 7.62mm)
• Op Amp Type: General Purpose
• No. Of Amplifiers: 4
• Bandwidth: 6MHz
• Supply Voltage Range: ± 4.5V To ± 18V
• Amplifier Case Style: DIP
• No. Of Pins: 14
• Channel Separation: 125
• Common Mode Rejection Ratio: 100
• Current, Input Bias: 25 nA
• Current, Input Offset: 12 nA
• Current, Supply: 9 mA
• Impedance, Thermal: 33 °C/W
• Number Of Amplifiers: Quad
• Package Type: PDIP-14
• Resistance, Input: 0.4 Megohms (Differential), 11 Gigaohms (Common-Mode)
• Temperature, Operating, Range: -40 to +85 °C
• Voltage, Gain: 1700 V/mV
• Voltage, Input: ±11, ±12 V
• Voltage, Noise: 3.8 nV/sqrt Hz
• Voltage, Offset: 0.4 mV
• Voltage, Output, High: +13 V
• Voltage, Output, Low: -13 V
• Voltage, Supply: ±15 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Output Type: -
• Current - Output / Channel: -
• -3db Bandwidth: -
• Lead Free Status / Rohs Status: RoHS Compliant part Electrostatic Device

4. The test time to measure 0.1 Hz to 10 Hz noise should not ex-
5. A noise-voltage-density test is recommended when measuring
6. Power should be supplied to the test circuit by well bypassed
Figure 8. 0.1 Hz to 10 Hz Peak-to-Peak Voltage Noise Test
Circuit Frequency Response
NOISE MEASUREMENT—NOISE VOLTAGE DENSITY
The circuit of Figure 9 shows a quick and reliable method of
measuring the noise voltage density of quad op amps. Each
individual amplifier is series-connected and is in unity-gain, save
the final amplifier which is in a noninverting gain of 101. Since
the ac noise voltages of each amplifier are uncorrelated, they
add in rms fashion to yield:
REV. B
ceed 10 seconds. As shown in the noise-tester frequency-response
curve of Figure 8, the 0.1 Hz corner is defined by only one pole.
The test time of 10 seconds acts as an additional pole to elimi-
nate noise contribution from the frequency band below 0.1 Hz.
noise on a large number of units. A 10 Hz noise voltage-density
measurement will correlate well with a 0.1 Hz to 10 Hz
peak-to-peak noise reading, since both results are determined
by the white noise and the location of the 1/f corner frequency.
low noise supplies, e.g. batteries. These will minimize output
noise introduced via the amplifier supply pins.
100
80
60
40
20
0
0.01
e
OUT
= 101
0.1
Ê
Ë
e
FREQUENCY – Hz
nA
2
1/4
OP470
+ e
1
nB
2
+
e
nC
Figure 9. Noise Voltage Density Test Circuit
2
10
+
1/4
OP470
e
nD
2
ˆ
¯
100
1/4
OP470
–11–
100
The OP470 is a monolithic device with four identical amplifiers.
The noise voltage density of each individual amplifier will match,
giving:
NOISE MEASUREMENT—CURRENT NOISE DENSITY
The test circuit shown in Figure 10 can be used to measure
current noise density. The formula relating the voltage output to
current noise density is:
where:
R1
R1
5
e
V
OUT
S
=
Figure 10. Current Noise Density Test Circuit
(nV Hz) = 101(2e
15V
100k
1/4
OP470
R2
10k
R2
e
OUT
i
G = gain of 10000
R
n
S
=
OP470
DUT
= 100 kW source resistance
TO SPECTRUM ANALYZER
1.24k
=
n
R3
Ê
Á
Ë
)
101
nOUT
200
G
e
R4
OUT
Ê
Ë
ˆ
˜ -
¯
4e
2
n
OP27E
R
2
(
40nV / Hz
S
ˆ
¯
8.06k
= 101 2e
R5
GAIN = 50,000
V
S
=
5V
( )
)
e
SPECTRUM ANALYZER
2
n
n
OP470
OUT TO