LMV841MG/NOPB National Semiconductor, LMV841MG/NOPB Datasheet - Page 5

• Manufacturer Part Number: LMV841MG/NOPB
• Description: IC OPAMP R-R I/O L-V L-P SC70-5
• Manufacturer: National Semiconductor

Specifications of LMV841MG/NOPB

• Amplifier Type: General Purpose
• Number Of Circuits: 1
• Output Type: Rail-to-Rail
• Slew Rate: 2.5 V/µs
• Gain Bandwidth Product: 4.5MHz
• Current - Input Bias: 0.3pA
• Voltage - Input Offset: 50µV
• Current - Supply: 1.03mA
• Current - Output / Channel: 37mA
• Voltage - Supply, Single/dual (±): 2.7 V ~ 12 V, ±1.35 V ~ 6 V
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: SC-70-5, SC-88A, SOT-323-5, SOT-353, 5-TSSOP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• -3db Bandwidth: -
• Other names: LMV841MG; LMV841MGTR

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics
Tables.
Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of JEDEC) Field-
Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).
, θ
Note 3: The maximum power dissipation is a function of T
, and T
. The maximum allowable power dissipation at any ambient temperature is
J(MAX)
JA
A
) / θ
P
= (T
- T
. All numbers apply for packages soldered directly onto a PC board.
D
J(MAX)
A
JA
Note 4: Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating
of the device.
Note 5: Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will
also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.
Note 6: Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using statistical quality
control (SQC) method.
Note 7: This parameter is guaranteed by design and/or characterization and is not tested in production.
Note 8: Positive current corresponds to current flowing into the device.
Note 9: Short circuit test is a momentary test.
Note 10: Number specified is the slower of positive and negative slew rates.
Connection Diagrams
5-Pin SC70
8-Pin SOIC and MSOP
20168302
20168303
Top View
Top View
14–Pin SOIC and TSSOP
20168304
Top View
5
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