A3P1000L-PQG208 Actel, A3P1000L-PQG208 Datasheet - Page 52
A3P1000L-PQG208
Manufacturer Part Number
A3P1000L-PQG208
Description
FPGA - Field Programmable Gate Array 1M SYSTEM GATES
Manufacturer
Actel
Datasheet
1.A3P250L-VQG100.pdf
(224 pages)
Specifications of A3P1000L-PQG208
Processor Series
A3P1000
Core
IP Core
Maximum Operating Frequency
781.25 MHz
Number Of Programmable I/os
154
Data Ram Size
147456
Supply Voltage (max)
1.26 V
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Development Tools By Supplier
A3PE-Proto-Kit, A3PE-Brd1500-Skt, Silicon-Explorer II, Silicon-Sculptor 3, SI-EX-TCA, FlashPro 4, FlashPro 3, FlashPro Lite
Mounting Style
SMD/SMT
Supply Voltage (min)
1.14 V
Number Of Gates
1 M
Package / Case
PQFP-208
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
A3P1000L-PQG208
Manufacturer:
Microsemi SoC
Quantity:
10 000
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ProASIC3L DC and Switching Characteristics
Table 2-43 • Duration of Short Circuit Event before Failure
Table 2-44 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
2- 38
Temperature
–40°C
0°C
25°C
70°C
85°C
100°C
110°C
Input Buffer
LVTTL/LVCMOS
LVDS/B-LVDS/
M-LVDS/LVPECL
*
The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the noise is low, then the
rise time and fall time of input buffers can be increased beyond the maximum value. The longer the rise/fall times, the
more susceptible the input signal is to the board noise. Actel recommends signal integrity evaluation/characterization
of the system to ensure that there is no excessive noise coupling into input signals.
Input Rise/Fall Time (min.)
No requirement
No requirement
R e visio n 9
Input Rise/Fall Time (max.)
Time before Failure
10 ns *
10 ns *
> 20 years
> 20 years
> 20 years
6 months
3 months
5 years
2 years
20 years (110°C)
10 years (100°C)
Reliability
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