AD5560JSVUZ-REEL Analog Devices Inc, AD5560JSVUZ-REEL Datasheet - Page 10

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AD5560JSVUZ-REEL

Manufacturer Part Number
AD5560JSVUZ-REEL
Description
1.2A Programmable DPS With DACs
Manufacturer
Analog Devices Inc
Type
Power Supplyr
Datasheet

Specifications of AD5560JSVUZ-REEL

Design Resources
Integrated Device Power Supply for PAD with Output Voltage Range 0 V to 25 V (CN0130)
Applications
Automatic Test Equipment
Mounting Type
Surface Mount
Package / Case
64-TQFP Exposed Pad, 64-eTQFP, 64-HTQFP, 64-VQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AD5560JSVUZ-REEL
Manufacturer:
Analog Devices Inc
Quantity:
10 000
Part Number:
AD5560JSVUZ-REEL
Manufacturer:
ADI/亚德诺
Quantity:
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AD5560
Parameter
REFERENCE INPUT
COMPARATOR
VOLTAGE COMPARATOR
CURRENT COMPARATOR
MEASURE OUTPUT, MEASOUT
OPEN-SENSE DETECT/CLAMP/ALARM
DUTGND
GUARD AMPLIFIER
DIE TEMPERATURE SENSOR
Comparator DAC Dynamic
VREF DC Input Impedance
VREF Input Current
VREF Range
Error
Propagation Delay
Error
Propagation Delay
Error
Measure Output Voltage Span
Measure Output Voltage Span
Measure Output Voltage Span
Measure Output Voltage Span
Measure Pin Output Impedance
Output Leakage Current
Output Capacitance
Short-Circuit Current
Measurement Accuracy
Clamp Accuracy
Alarm Delay
Voltage Range
Pull-Up Current
Leakage Current
Trip Point Accuracy
Alarm Delay
Voltage Range
Voltage Span
Output Offset
Short-Circuit Current
Load Capacitance
Output Impedance
Alarm Delay
Accuracy
Output Voltage at 25°C
Output Scale Factor
Output Voltage Range
Output Voltage Settling Time
Slew Rate
Digital-to-Analog Glitch Energy
Glitch Impulse Peak Amplitude
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
Min
1
−10
2
−7
−12
−1.5
−12.81
−6.405
0
0
−100
−10
−200
−1
−1
−30
AV
−10
−20
−10
1
SS
+ 2.25
3.5
1
10
40
0.25
0.25
5
600
50
+50
50
100
200
1.54
4.7
Typ
Rev. C | Page 10 of 60
Max
6
+10
5
+7
+12
1
+1.5
+12.81
+6.405
5.125
2.56
115
+100
+10
+200
900
+1
+70
+1
+10
AV
25
+10
+20
100
+10
2
DD
− 2.25
Unit
μs
V/μs
nV-s
mV
μA
V
mV
μs
mV
μs
%
V
V
V
V
Ω
nA
pF
mA
mV
mV
μs
V
μA
μA
mV
μs
V
V
mV
mA
nF
Ω
μs
%
V
mV/°C
V
Test Conditions/Comments
1 V change to 1 LSB.
Typically 100 MΩ.
Per input; typically ±30 nA.
Measured directly at comparator; does not
include measure block errors.
Uncalibrated.
With respect to the measured voltage.
Uncalibrated.
Of programmed current range, uncalibrated.
MEASOUT gain = 1, V
0x8000.
MEASOUT gain = 1, V
MEASOUT gain = 0.2, V
0x8000.
MEASOUT gain = 0.2, V
When HW_INH is low.
Pull-up for purpose of detecting open circuit on
DUTGND, can be disabled.
When pull-up disabled, DGS DAC = 0x3333 (1 V
with V
from one of comparator thresholds, more
leakage may be present.
If it moves 100 mV away from input level.
Relative to a temperature change.
REF
= 5 V). If DUTGND voltage is far away
REF
REF
REF
REF
= 5 V, offset DAC =
= 2.5 V.
= 5 V, offset DAC =
= 2.5 V.

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