ADE7758ARWZRL Analog Devices Inc, ADE7758ARWZRL Datasheet - Page 8

• Manufacturer Part Number: ADE7758ARWZRL
• Description: IC,Power Metering,SOP,24PIN,PLASTIC
• Manufacturer: Analog Devices Inc

Specifications of ADE7758ARWZRL

• Input Impedance: 380 KOhm
• Measurement Error: 0.1%
• Voltage - I/o High: 2.4V
• Voltage - I/o Low: 0.8V
• Current - Supply: 8mA
• Voltage - Supply: 4.75 V ~ 5.25 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 24-SOIC (0.300", 7.50mm Width)
• Meter Type: 3 Phase
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADE7758
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
AVDD to AGND
DVDD to DGND
DVDD to AVDD
Analog Input Voltage to AGND,
Reference Input Voltage to AGND
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature
Storage Temperature Range
Junction Temperature
24-Lead SOIC, Power Dissipation
Lead Temperature, Soldering
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
A
IAP, IAN, IBP, IBN, ICP, ICN, VAP,
VBP, VCP, VN
Industrial Range
θ
Vapor Phase (60 sec)
Infrared (15 sec)
= 25°C, unless otherwise noted.
JA
Thermal Impedance
Rating
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to +0.3 V
–6 V to +6 V
–0.3 V to AVDD + 0.3 V
–0.3 V to DVDD + 0.3 V
–0.3 V to DVDD + 0.3 V
–40°C to +85°C
–65°C to +150°C
150°C
88 mW
53°C/W
215°C
220°C
Rev. D | Page 8 of 72
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.