EVAL-AD7841EBZ Analog Devices Inc, EVAL-AD7841EBZ Datasheet - Page 4

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EVAL-AD7841EBZ

Manufacturer Part Number
EVAL-AD7841EBZ
Description
Evaluation Board I.c.
Manufacturer
Analog Devices Inc
Datasheets

Specifications of EVAL-AD7841EBZ

Number Of Dac's
8
Number Of Bits
14
Outputs And Type
8, Single Ended
Sampling Rate (per Second)
32k
Data Interface
Parallel
Settling Time
31µs
Dac Type
Voltage
Voltage Supply Source
Analog and Digital, Dual ±
Operating Temperature
-40°C ~ 85°C
Utilized Ic / Part
AD7841
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD7841
ABSOLUTE MAXIMUM RATINGS
(T
V
V
V
Digital Inputs to GND . . . . . . . . . . . . . . –0.3 V, V
V
V
V
DUTGND to GND . . . . . . . . . . . . . V
V
Operating Temperature Range
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
CC
DD
SS
REF
REF
REF
OUT
A
(Whichever Is Lower)
Industrial (A Version) . . . . . . . . . . . . . . . –40°C to +85°C
= 25°C unless otherwise noted)
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V, –17 V
to GND
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +17 V
(+) to V
(+) to GND . . . . . . . . . . . . . . . V
(–) to GND . . . . . . . . . . . . . . . V
(A–H) to GND . . . . . . . . . . . . V
3
REF
. . . . . . . . . . . . . . –0.3 V, +7 V or V
(–) . . . . . . . . . . . . . . . . . . . . . –0.3 V, +18 V
DUTGND_AB
1, 2
V
V
REF
REF
SS
SS
SS
SS
V
LDAC
(–)AB
(+)AB
OUT
– 0.3 V, V
– 0.3 V, V
– 0.3 V, V
– 0.3 V, V
V
V
CS
DD
A2
A1
A0
SS
A
10
11
1
2
3
4
5
6
7
8
9
12
44
PIN 1
IDENTIFIER
DD
DD
DD
DD
DD
CC
43
PIN CONFIGURATION
13
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
42
14
15
41
(Not to Scale)
TOP VIEW
16
40
AD7841
39
17
38
18
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
MQFP Package
NOTES
1
2
3
Lead Temperature ............................JEDEC Industry Standard
Soldering ......................................................................J-STD-020
ESD .................................................................................. >4000 V
Stresses above those listed under Absolute Maximum Ratings may cause perma-
Transient currents of up to 100 mA will not cause SCR latch-up.
V
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
during power supply sequencing, the following diode protection scheme will ensure
protection.
CC
Power Dissipation . . . . . . . . . . . . . . . . . (T
θ
37
19
JA
must not exceed V
20
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 95°C/W
36 35
21
34
22
33
32
31
30
29
28
27
26
25
24
23
DUTGND_GH
V
V
V
CLR
DB13
DB12
DB11
DB10
DB9
DB8
IN4148
OUT
REF
REF
DD
(–)GH
(+)GH
H
by more than 0.3 V. If it is possible for this to happen
V
V
DD
DD
HP5082-2811
AD7841
V
V
CC
CC
J
Max – T
REV. B
A
)/θ
JA

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