FDY3000NZ Fairchild Semiconductor, FDY3000NZ Datasheet
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FDY3000NZ
Specifications of FDY3000NZ
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FDY3000NZ Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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Change To Results/Discussion for Qual Plan NumberQ20080344 Test: (Autoclave) Lot Device Q20080344AAACLV FDY2000PZ Q20080344BAACLV FDY300NZ Q20080344CAACLV FDY4000CZ Test: (High Temperature Gate Bias) Lot Device Q20080344AAHTGB FDY2000PZ 96-HOURS 0/79 0/79 0/79 168-HOURS 500-HOURS 1000-HOURS 0/79 0/79 Failure Code Failure Code Pg. ...
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... FDY101PZ FDY3000NZ FDY301NZ FDY4001CZ FJY3003R FJY3006R FJY3009R FJY3012R FJY3015R FJY4003R FJY4006R FJY4009R FJY4012R FJYF2906TF MMBT3906T 0/79 0/79 Failure Code Failure Code 1000-HOURS Failure Code ...