IRF634B_FP001 Fairchild Semiconductor, IRF634B_FP001 Datasheet
IRF634B_FP001
Specifications of IRF634B_FP001
Related parts for IRF634B_FP001
IRF634B_FP001 Summary of contents
Page 1
... Thermal Resistance, Junction-to-Case Max Thermal Resistance, Case-to-Sink Typ Thermal Resistance, Junction-to-Ambient Max. JA ©2001 Fairchild Semiconductor Corporation Features • 8.1A, 250V, R • Low gate charge ( typical 29 nC) • Low Crss ( typical 20 pF) • Fast switching • 100% avalanche tested • Improved dv/dt capability ...
Page 2
... Repetitive Rating : Pulse width limited by maximum junction temperature 4.9mH 8.1A 50V ≤ 8.1A, di/dt ≤ 300A ≤ DSS, 4. Pulse Test : Pulse width ≤ 300 s, Duty cycle ≤ Essentially independent of operating temperature ©2001 Fairchild Semiconductor Corporation T = 25°C unless otherwise noted C Test Conditions 250 250 A, Referenced to 25° 250 ...
Page 3
... Drain Current [A] D Figure 3. On-Resistance Variation vs Drain Current and Gate Voltage 2000 1500 C iss C 1000 oss C rss 500 Drain-Source Voltage [V] DS Figure 5. Capacitance Characteristics ©2001 Fairchild Semiconductor Corporation ※ Notes : 1. 250μ s Pulse Test 25℃ 10V GS = 20V 0 10 ※ Note : ℃ ...
Page 4
... V , Drain-Source Voltage [V] DS Figure 9-1. Maximum Safe Operating Area for IRF634B Case Temperature [ ℃ Figure 10. Maximum Drain Current vs Case Temperature ©2001 Fairchild Semiconductor Corporation (Continued) 3.0 2.5 2.0 1.5 1.0 ※ Notes : 250 μ 0.5 D 0.0 -100 100 150 200 o C] Figure 8 ...
Page 5
... Typical Characteristics Figure 11-1. Transient Thermal Response Curve for IRF634B Figure 11-2. Transient Thermal Response Curve for IRFS634B ©2001 Fairchild Semiconductor Corporation (Continued) ※ θ tio ※ θ tio ( ℃ (t) θ ( ℃ (t) θ Rev. A, November 2001 ...
Page 6
... Resistive Switching Test Circuit & Waveforms 10V 10V Unclamped Inductive Switching Test Circuit & Waveforms 10V 10V ©2001 Fairchild Semiconductor Corporation Gate Charge Test Circuit & Waveform Same Type Same Type as DUT as DUT 10V 10V DUT DUT 10% 10 DUT DUT ...
Page 7
... Peak Diode Recovery dv/dt Test Circuit & Waveforms Driver ) ( Driver ) DUT ) ( DUT ) DUT ) ( DUT ) ©2001 Fairchild Semiconductor Corporation + + DUT DUT Driver Driver Same Type Same Type as DUT as DUT • dv/dt controlled by R • dv/dt controlled by R • I • I controlled by pulse period ...
Page 8
... Package Dimensions 9.90 (8.70) ø3.60 1.27 0.10 2.54TYP [2.54 ] 0.20 10.00 ©2001 Fairchild Semiconductor Corporation TO-220 0.20 0.10 1.52 0.10 0.80 0.10 2.54TYP [2.54 ] 0.20 0.20 4.50 0.20 +0.10 1.30 –0.05 +0.10 0.50 2.40 0.20 –0.05 Dimensions in Millimeters Rev. A, November 2001 ...
Page 9
... Package Dimensions (Continued) 10.16 (7.00) MAX1.47 0.80 0.10 #1 0.35 0.10 2.54TYP [2.54 ] 0.20 9.40 ©2001 Fairchild Semiconductor Corporation TO-220F ø3.18 0.20 0.10 (1.00x45 ) 0.50 2.54TYP [2.54 ] 0.20 0.20 2.54 0.20 (0.70) +0.10 2.76 –0.05 0.20 Dimensions in Millimeters Rev. A, November 2001 ...
Page 10
... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ACEx™ FAST Bottomless™ FASTr™ CoolFET™ FRFET™ CROSSVOLT™ GlobalOptoisolator™ DenseTrench™ GTO™ ...