LFE2M20E-6FN484C LATTICE SEMICONDUCTOR, LFE2M20E-6FN484C Datasheet - Page 103

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LFE2M20E-6FN484C

Manufacturer Part Number
LFE2M20E-6FN484C
Description
FPGA LatticeECP2M Family 19000 Cells 90nm (CMOS) Technology 1.2V 484-Pin FBGA
Manufacturer
LATTICE SEMICONDUCTOR
Datasheet

Specifications of LFE2M20E-6FN484C

Package
484FBGA
Family Name
LatticeECP2M
Device Logic Units
19000
Typical Operating Supply Voltage
1.2 V
Maximum Number Of User I/os
304
Ram Bits
1246208

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Lattice Semiconductor
Switching Test Conditions
Figure 3-22 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 3-19.
Figure 3-22. Output Test Load, LVTTL and LVCMOS Standards
Table 3-19. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
*CL Includes Test Fixture and Probe Capacitance
DUT
V
R1
R2
T
1M
100
R
1
3-51
1M
100
R
CL*
2
Test Poi nt
0pF
C
DC and Switching Characteristics
LatticeECP2/M Family Data Sheet
L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.10
- 0.10
/2
/2
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
CCIO
CCIO
V
T

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