EP3SL150F1152C3N Altera, EP3SL150F1152C3N Datasheet - Page 40
![IC STRATX III FPGA 150K 1152FBGA](/photos/6/72/67293/544-1152-fbga_sml.jpg)
EP3SL150F1152C3N
Manufacturer Part Number
EP3SL150F1152C3N
Description
IC STRATX III FPGA 150K 1152FBGA
Manufacturer
Altera
Series
Stratix® IIIr
Datasheets
1.EP3SL150F780C4N.pdf
(16 pages)
2.EP3SL150F780C4N.pdf
(332 pages)
3.EP3SL150F780C4N.pdf
(456 pages)
Specifications of EP3SL150F1152C3N
Number Of Logic Elements/cells
142500
Number Of Labs/clbs
5700
Total Ram Bits
6390
Number Of I /o
744
Voltage - Supply
0.86 V ~ 1.15 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1152-FBGA
For Use With
544-2568 - KIT DEVELOPMENT STRATIX III
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Other names
544-2408
EP3SL150F1152C3NES
EP3SL150F1152C3NES
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
EP3SL150F1152C3N
Manufacturer:
ALTERA
Quantity:
490
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SEU Mitigation
Programmable Power
Stratix III Device Handbook, Volume 1
f
f
f
The design security feature is available when configuring Stratix III FPGAs using the
fast passive parallel (FPP) configuration mode with an external host (such as a MAX II
device or microprocessor), or when using fast active serial (AS) or passive serial (PS)
configuration schemes.
For more information about the design security feature, refer to the
Stratix III Devices
Stratix III devices have built-in error detection circuitry to detect data corruption due
to soft errors in the configuration random-access memory (CRAM) cells. This feature
allows all CRAM contents to be read and verified continuously during user mode
operation to match a configuration-computed CRC value. The enhanced CRC circuit
and frame-based configuration architecture allows detection and location of multiple,
single, and adjacent bit errors which, in conjunction with a soft circuit supplied as a
reference design, allows don’t-care soft errors in the CRAM to be ignored during
device operation. This provides a steep decrease in the effective soft error rate,
increasing system reliability.
On-chip memory block SEU mitigation is also offered using the ninth bit and a
configurable megafunction in the Quartus II software for MLAB and M9K blocks
while the M144K memory blocks have built-in error correction code (ECC) circuitry.
For more information about the dedicated error detection circuitry, refer to the
Mitigation in Stratix III Devices
Stratix III delivers Programmable Power, the only FPGA with user programmable
power options balancing today’s power and performance requirements. Stratix III
devices utilize the most advanced power-saving techniques, including a variety of
process, circuit, and architecture optimizations and innovations. In addition, user
controllable power reduction techniques provide an optimal balance of performance
and power reduction specific for each design configured into the Stratix III FPGA. The
Quartus II software (starting from version 6.1) automatically optimizes designs to
meet the performance goals while simultaneously leveraging the programmable
power-saving options available in the Stratix III FPGA without the need for any
changes to the design flow.
For more information about Programmable Power in Stratix III devices, refer to the
following documents:
■
■
■
Programmable Power and Temperature Sensing Diode in Stratix III Devices
AN 437: Power Optimization in Stratix III FPGAs
Stratix III Programmable Power White Paper
chapter.
chapter.
Chapter 1: Stratix III Device Family Overview
© March 2010 Altera Corporation
Design Security in
Architecture Features
chapter
SEU
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