EP2S90F1020I4N Altera, EP2S90F1020I4N Datasheet - Page 127

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EP2S90F1020I4N

Manufacturer Part Number
EP2S90F1020I4N
Description
IC STRATIX II FPGA 90K 1020-FBGA
Manufacturer
Altera
Series
Stratix® IIr
Datasheet

Specifications of EP2S90F1020I4N

Number Of Logic Elements/cells
90960
Number Of Labs/clbs
4548
Total Ram Bits
4520488
Number Of I /o
758
Voltage - Supply
1.15 V ~ 1.25 V
Mounting Type
Surface Mount
Operating Temperature
-40°C ~ 100°C
Package / Case
1020-FBGA
Family Name
Stratix II
Number Of Logic Blocks/elements
90960
# I/os (max)
758
Frequency (max)
711.24MHz
Process Technology
90nm (CMOS)
Operating Supply Voltage (typ)
1.2V
Logic Cells
90960
Ram Bits
4520488
Operating Supply Voltage (min)
1.15V
Operating Supply Voltage (max)
1.25V
Operating Temp Range
-40C to 100C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
1020
Package Type
FC-FBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Compliant
Other names
544-1920
EP2S90F1020I4N

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Figure 3–2. Temperature vs. Temperature-Sensing Diode Voltage
Automated
Single Event
Upset (SEU)
Detection
Altera Corporation
May 2007
(Across Diode)
Voltage
0.95
0.90
0.85
0.80
0.75
0.70
0.65
0.60
0.55
0.50
0.45
0.40
–55
The temperature-sensing diode works for the entire operating range, as
shown in
The temperature sensing diode is a very sensitive circuit which can be
influenced by noise coupled from other traces on the board, and possibly
within the device package itself, depending on device usage. The
interfacing device registers temperature based on milivolts of difference
as seen at the TSD. Switching I/O near the TSD pins can affect the
temperature reading. Altera recommends you take temperature readings
during periods of no activity in the device (for example, standby mode
where no clocks are toggling in the device), such as when the nearby I/Os
are at a DC state, and disable clock networks in the device.
Stratix II devices offer on-chip circuitry for automated checking of single
event upset (SEU) detection. Some applications that require the device to
operate error free at high elevations or in close proximity to Earth’s North
or South Pole require periodic checks to ensure continued data integrity.
The error detection cyclic redundancy check (CRC) feature controlled by
–30
Figure
3–2.
–5
Temperature (˚C)
20
45
Stratix II Device Handbook, Volume 1
70
100 μA Bias Current
10 μA Bias Current
Configuration & Testing
95
120
3–13

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