DS33R11+ Maxim Integrated Products, DS33R11+ Datasheet - Page 341

IC ETH TXRX T1/E1/J1 256-BGA

DS33R11+

Manufacturer Part Number
DS33R11+
Description
IC ETH TXRX T1/E1/J1 256-BGA
Manufacturer
Maxim Integrated Products
Type
Transceiverr
Datasheet

Specifications of DS33R11+

Protocol
T1/E1/J1
Voltage - Supply
1.8V, 3.3V
Mounting Type
Surface Mount
Package / Case
256-BGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Drivers/receivers
-
14.3 JTAG ID Codes
Table 14-2. ID Code Structure
14.4 Test Registers
IEEE 1149.1 requires a minimum of two test registers: the bypass register and the boundary scan register. An
optional test register has been included with the DS26521 design. This test register is the identification register
and is used in conjunction with the IDCODE instruction and the Test-Logic-Reset state of the TAP controller.
14.4.1 Boundary Scan Register
This register contains both a shift register path and a latched parallel output for all control cells and digital I/O cells
and is n bits in length.
14.4.2 Bypass Register
This is a single one-bit shift register used in conjunction with the BYPASS, CLAMP, and HIGHZ instructions, which
provides a short path between JTDI and JTDO.
14.4.3 Identification Register
The identification register contains a 32-bit shift register and a 32-bit latched parallel output. This register is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state.
Transceiver
T1/E1/J1
DEVICE
Ethernet
Mapper
REVISION
ID[31:28]
0000
0000
0000 0000 0110 0001
0000 0000 0001 0000
DEVICE CODE
ID[27:12]
341 of 344
MANUFACTURER’S CODE
000 1010 0001
000 1010 0001
ID[11:1]
REQUIRED
ID[0]
1
1

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