MCZ33290EFR2 Freescale Semiconductor, MCZ33290EFR2 Datasheet - Page 4

• Manufacturer Part Number: MCZ33290EFR2
• Description: IC SER LNK INTER ISO KLINE 8SOIC
• Manufacturer: Freescale Semiconductor

Specifications of MCZ33290EFR2

• Applications: Automotive
• Interface: Serial
• Voltage - Supply: 8 V ~ 18 V
• Package / Case: *
• Mounting Type: Surface Mount
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: MCZ33290EFR2TR

4
Table 2. Maximum Ratings
33290
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
permanent damage to the device.
Notes
VDD DC Supply Voltage
VBB Load Dump Peak Voltage
ISO Pin Load Dump Peak Voltage
ISO Short Circuit Current Limit
ESD Voltage
ISO Clamp Energy
Storage Temperature
Operating Case Temperature
Operating Junction Temperature
Power Dissipation
Peak Package Reflow Temperature During Reflow
Thermal Resistance
2.
3.
4.
5.
6.
7.
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
Human Body Model
Machine Model
T
Junction-to-Ambient
A
= 25°C
Device will survive double battery jump start conditions in typical applications for 10 minutes duration, but is not guaranteed to remain
within specified parametric limits during this duration.
ESD data available upon request.
ESD1 testing is performed in accordance with the Human Body Model (C
accordance with the Machine Model (C
Nonrepetitive clamping capability at 25°C.
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL),
Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e.
MC33xxxD enter 33xxx), and review parametrics.
(3)
(4)
(5)
(4)
Rating
(2)
ELECTRICAL CHARACTERISTICS
ZAP
= 200 pF, R
(6)
,
(7)
MAXIMUM RATINGS
ZAP
= 0 Ω).
Symbol
I
V
ISO(LIM)
V
V
E
T
ZAP
V
R
BB(LD)
V
T
PPRT
ESD1
ESD2
clamp
P
T
T
ISO
θJA
DD
stg
C
D
J
= 100 pF, R
ZAP
Analog Integrated Circuit Device Data
= 1500 Ω), ESD2 testing is performed in
-55 to +150
-40 to +125
-40 to +150
-0.3 to 7.0
Note 7.
±2000
Value
±200
150
1.0
0.8
45
40
10
Freescale Semiconductor
°C/W
Unit
mJ
°C
°C
°C
°C
W
V
V
V
A
V