CM05CG1R2B50AH AVX Corporation, CM05CG1R2B50AH Datasheet - Page 11

CM05CG1R2B50AH

Manufacturer Part Number
CM05CG1R2B50AH
Description
Manufacturer
AVX Corporation
Datasheet

Specifications of CM05CG1R2B50AH

Capacitance
1.2pF
Tolerance (+ Or -)
0.1pF
Voltage
50VDC
Temp Coeff (dielectric)
C0G
Operating Temp Range
-55C to 125C
Mounting Style
Surface Mount
Package / Case
0402
Construction
SMT Chip
Case Style
Ceramic Chip
Failure Rate
Not Required
Wire Form
Not Required
Product Length (mm)
1mm
Product Depth (mm)
0.5mm
Product Height (mm)
0.55mm
Product Diameter (mm)
Not Requiredmm
Lead Free Status / Rohs Status
Compliant
Multilayer Ceramic Chip Capacitors
Test Conditions and Standards
Test Conditions and Specifications for High Dielectric Type (X5R, X7R, Y5V)
∗1
∗2
∗3
∗4
∗5
∗6
∗7
∗8
∗9
Capacitance Value
tanδ (%)
Insulation resistance (IR)
Dielectric resistance
Appearance
Termination strength
Bending strength test
Vibration
test
Soldering
heat
resistance
Solderability
Temperature
cycle
Load
humidity
test
High−
temperature
with
loading
Use 1.5 times when the rated voltage is 250V or over.
Use 1.2 times when the rated voltage is 630V or over.
X7R 16V/ 25V type.
Apply to X5R16V/ 25V type, X7R 6.3V/ 10V type.
Apply to Y5V 16V type, CM32Y5V335 to 106 (25V Type).
Apply to Y5V 6.3V/ 10V type. Apply 16% max. to CM21Y5V106/ CM316Y5V226.
Exclude CT series with thickness of less than 0.66mm and CA series.
Use 1.5 times when the rated voltage is 4V/ 6.3V/ 10V/ 250V and 100V (32X7R474/
43X7R105/ 55X7R105).
Use 1.2 times when the rated voltage is 630V or over.
Keep specimen at 150°C+0/ −10°C for one hour, leave specimen at room ambient
for 48±4 hours.
Apply the same test condition for one hour, then leave the specimen at room ambi-
ent for 48±4 hours.
(∗11)
Test Items
Appearance
∆C
tanδ (%)
Appearance
∆C
tanδ (%)
IR
Withstand voltage
Appearance
∆C
tanδ (%)
IR
Withstand voltage
Appearance
∆C
tanδ (%)
IR
Appearance
∆C
tanδ (%)
IR
(∗15)
(∗15)
(∗15)
(∗15)
(∗15)
(∗6)
(∗6)
(∗15)
(∗15)
(∗15)
Within tolerance
2.5% max., 3.5% max. (∗2), 7.0% max. (∗12)
10,000MΩ or 500MΩ
No problem observed
No problem observed
No problem observed
No problem observed at 1mm bent
No significant change is detected
Within tolerance
Satisfies the initial value
No significant change is detected
Satisfies the initial value
10,000MΩ or 500MΩ
Resists without problem
Ni/ Br termination: 90% min.
No significant change is detected
Satisfies the initial value
10,000MΩ or 500MΩ
Resists without problem
No significant change is detected
500MΩ or 25MΩ
No significant change is detected
1,000MΩ or 50MΩ
200% max. of initial value
200% max. of initial value
5.0% max. (∗3), 7.5% max. (∗17)
Within ±12.5%
Within ±12.5%
Within ±7.5%
Within ±7.5%
X7R/ X5R
µF min., whichever is smaller
µF min., whichever is smaller
µF min., whichever is less
µF min., whichever is smaller
µF min., whichever is samller
Specifications
9.0% max. (∗4), 12.5% max. (∗5)
150% max. of initial value
150% max. of initial value
5.0% max., 7.0% max. (∗13)
∗10
∗11
∗12
∗13
∗14
∗15
∗16
∗17
∗ The above test conditions and standards do not apply to products with optional specifications.
Within ±20%
Within ±20%
Within ±30%
Within ±30%
For the CF series over 630V, apply 500V for 1 minutes at room ambient.
Except CF series.
Apply to X5R 10V type.
Apply to 25V series of CM105Y5V154 over, CM21Y5V105 over, 316Y5V155 over.
Measurement condition 1kHz, 1Vrms for Y5V, C<47µF type.
The charge/ discharge current of the capacitor must not exceed 50mA.
2N at 0201 Size
Apply to X5R 4V and 6.3V type.
Y5V
Do previous treatment (∗8, ∗14)
Measured after the rated voltage is applied for 2 minutes
at normal room temperature and humidity. (∗10)
(∗1) Apply 2.5 times of the rated voltage for 1 to 5 seconds.
Microscope (10×magnification)
Apply a sideward force of 500g (5N) (∗16) to a
PCB−mounted sample.
Glass epoxy PCB (∗03, 05 type and CA Series: T=0.8mm);
fulcrum Spacing: 90mm; for 10 seconds.
Vibration frequency: 10 to 55 (Hz)
Amplitude: 1.5mm
Sweeping condition: 10→55→10Hz/ min.
In X, Y and Z directions:
2 hours each Total 6 hours
Do previous treatment (∗8)
Soak the sample in 260°C±5°C
solder for 10±0.5 seconds
and place in a room at normal temperature
and humidity; measure after 48±4 hours.
(Preheating Conditions)
Soaking Condition
Do previous treatment (∗8)
(Cycle)
Normal room temperature (3 min.) →
Lowest operation temperature (30 min.) →
Normal room temperature (3 min.) →
Highest operation temperature (30 min.) →
After five cycles, measure after 48±4hours.
Do previous treatment (∗9)
After applying rated voltage at
40±2°C and humidty 90 to 95%RH,
for 500+24/ −0 hours and keep at room
condition for 48±4 hours then measure
and check the specification limits.
Do previous treatment (∗9)
After applying twice (∗7) of the rated
voltage at the highest operating temperature
for 1000+48/ −0 hours, measure the sample
after storing 48±4 hours.
Sn63 Solder
Sn-3Ag-0.5Cu
Capacitance
Order
C≤10µF
C>10µF
1
2
Test Conditions
Temperature
150 to 200°C
80 to 100°C
120Hz±10% 0.5±0.1Vrms
1kHz±10%
235±5°C
245±5°C
Fire
1.0±0.2Vrms
2±0.5 sec.
3±0.5 sec.
2 minutes
2 minutes
Vol
Time

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