5962-8863604LA Cypress Semiconductor Corp, 5962-8863604LA Datasheet - Page 3

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5962-8863604LA

Manufacturer Part Number
5962-8863604LA
Description
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of 5962-8863604LA

Lead Free Status / Rohs Status
Not Compliant
DSCC FORM 2234
APR 97
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in
the solicitation or contract.
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-
PRF-38535 is required to identify when the QML flow option is used.
specified in MIL-PRF-38535, appendix A and herein.
shall be as specified on figure 2. When required in groups A, B, C, or D (see 4.3), the devices shall be programmed by the
manufacturer prior to test with a minimum of 50 percent of the total number of gates programmed or to any altered item
drawing pattern which includes at least 25 percent of the total number of gates programmed.
drawing.
as specified in table I and shall apply over the full case operating temperature range.
tests for each subgroup are described in table I.
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
(Copies of these documents are available online at
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
3. REQUIREMENTS
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
2. APPLICABLE DOCUMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.2 Truth table. The truth table shall be as specified on figure 2.
3.2.2.1 Unprogrammed devices. The truth table for unprogrammed devices for contracts involving no altered item drawing
3.2.2.2 Programmed devices. The truth tables for programmed devices shall be as specified by an attached altered item
3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.
DEPARTMENT OF DEFENSE SPECIFICATION
DEPARTMENT OF DEFENSE STANDARDS
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
MIL-STD-883
MIL-STD-1835 -
MIL-HDBK-103 -
MIL-HDBK-780 -
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
-
STANDARD
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
http://assist.daps.dla.mil/quicksearch/
SIZE
A
REVISION LEVEL
or
C
http://assist.daps.dla.mil
SHEET
5962-88636
or from
3

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