5962-8863604LA Cypress Semiconductor Corp, 5962-8863604LA Datasheet - Page 7

• Manufacturer Part Number: 5962-8863604LA
• Manufacturer: Cypress Semiconductor Corp

Specifications of 5962-8863604LA

• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C
d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
e. Subgroups 7 and 8 shall include verification of the truth table.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
c. Group C, subgroup 1 sample shall include devices tested in accordance with 4.3.1d.
(1)
(2)
changes which may affect capacitance. Sample size is fifteen devices with no failures and all input and output
terminals tested.
group A, subgroups 9, 10, and 11. Either of two techniques is acceptable:
DEFENSE SUPPLY CENTER COLUMBUS
(1)
(2)
(3)
Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify
programmability and ac performance without programming the user array. If this is done, the resulting test
patterns shall be verified on all devices during subgroups 9, 10, and 11, group A testing in accordance with
the sampling plan specified in MIL-STD-883, method 5005.
If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be
submitted to programming (see 3.2.2.2). If more than two devices fail to program, the lot shall be rejected.
At the manufacturer's option, the sample may be increased to 24 total devices with no more than 4 total
device failures allowable. Ten devices from the programmability sample shall be submitted to the
requirements of group A, subgroups 9, 10, and 11. If more than two devices fail, the lot shall be rejected.
At the manufacturer's option, the sample may be increased to 20 total devices with no more than 4 total
device failures allowable.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in method 1005 of MIL-STD-883.
TA = +125°C, minimum.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
IN
STANDARD
and C
OUT
measurement) shall be measured only for the initial test and after process or design
SIZE
A
REVISION LEVEL
C
SHEET
5962-88636
7