H5PS1G83EFR-S6C HYNIX SEMICONDUCTOR, H5PS1G83EFR-S6C Datasheet - Page 36

58T1895

H5PS1G83EFR-S6C

Manufacturer Part Number
H5PS1G83EFR-S6C
Description
58T1895
Manufacturer
HYNIX SEMICONDUCTOR
Datasheet

Specifications of H5PS1G83EFR-S6C

Memory Type
SDRAM
Memory Configuration
128M X 8
Access Time
15ns
Memory Case Style
FBGA
No. Of Pins
60
Operating Temperature Range
0°C To +85°C
Memory Size
1 Gbit
Rohs Compliant
Yes

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
H5PS1G83EFR-S6C
Manufacturer:
HYNIX
Quantity:
4 000
Part Number:
H5PS1G83EFR-S6C
Manufacturer:
SK Hynix Inc
Quantity:
1 600
Part Number:
H5PS1G83EFR-S6C
Manufacturer:
HYNIX/海力士
Quantity:
20 000
Company:
Part Number:
H5PS1G83EFR-S6C
Quantity:
7 000
Part Number:
H5PS1G83EFR-S6C-C
Manufacturer:
HYNIX
Quantity:
9 500
Part Number:
H5PS1G83EFR-S6C-C
Manufacturer:
HYNIX
Quantity:
135
Part Number:
H5PS1G83EFR-S6C-C-6Z
Manufacturer:
HYNIX
Quantity:
5 361
Rev. 0.4 / Nov 2008
10. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for
this parameter, but system performance (bus turnaround) will degrade accordingly.
11. MIN (t CL, t CH) refers to the smaller of the actual clock LOW time and the actual clock HIGH time as
provided to the device (i.e. this value can be greater than the minimum specification limits for t CL and t CH).
For example, t CL and t CH are = 50% of the period, less the half period jitter (t JIT(HP)) of the clock source,
and less the half period jitter due to crosstalk (t JIT(crosstalk)) into the clock traces.
12. t QH = t HP – t QHS, where:
13. tDQSQ: Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the
output drivers as well as output slew rate mismatch between DQS/ DQS and associated DQ in any given cycle.
14. t DAL = (nWR) + (tRP/tCK):
For each of the terms above, if not already an integer, round to the next highest integer. tCK refers to the appli-
cation clock period. nWR refers to the t WR parameter stored in the MR.
Example: For DDR533 at t CK = 3.75 ns with t WR programmed to 4 clocks. tDAL = 4 + (15 ns / 3.75 ns)
clocks =4 +(4)clocks=8clocks.
15. The clock frequency is allowed to change during self–refresh mode or precharge power-down mode.
In case of clock frequency change during precharge power-down, a specific procedure is required as described
in section 2.9.
16. ODT turn on time min is when the device leaves high impedance and ODT resistance begins to turn on.
17. ODT turn off time min is when the device starts to turn off ODT resistance.
18. tHZ and tLZ transitions occur in the same access time as valid data transitions. These parameters are
referenced to a specific voltage level which specifies when the device output is no longer driving (tHZ), or
begins driving (tLZ). Below figure shows a method to calculate the point when device is no longer driving
(tHZ), or begins driving (tLZ) by measuring the signal at two different voltages. The actual voltage measure-
ment points are not critical as long as the calculation is consistent.
tHP = minimum half clock period for any given cycle and is defined by clock HIGH or clock LOW (tCH, tCL).
tQHS accounts for:
ODT turn off time max is when the bus is in high impedance. Both are measured from tAOFD.
ODT turn on time max is when the ODT resistance is fully on. Both are measured from tAOND.
1) The pulse duration distortion of on-chip clock circuits; and
2) The worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the
next transition, both of which are, separately, due to data pin skew and output pattern effects, and
p-channel to n-channel variation of the output drivers.
H5PS1G43EFR
H5PS1G83EFR
H5PS1G63EFR
36

Related parts for H5PS1G83EFR-S6C