ADUC7122 Analog Devices, ADUC7122 Datasheet - Page 8

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ADUC7122

Manufacturer Part Number
ADUC7122
Description
Precision Analog Microcontroller, 12-Bit Analog I/O, ARM7TDMI® MCU
Manufacturer
Analog Devices
Datasheet

Specifications of ADUC7122

Mcu Core
ARM7 TDMI
Mcu Speed (mips)
40
Sram (bytes)
8192Bytes
Gpio Pins
32
Adc # Channels
13

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ADuC7122
Parameter
ESD TESTS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
All ADC channel specifications are guaranteed during normal MicroConverter core operation.
Applies to all ADC input channels.
Measured using the factory-set default values in the ADC offset register (ADCOF) and gain coefficient register (ADCGN); see the the Calibration section.
Not production tested but supported by design and/or characterization data on production release.
Measured using the factory-set default values in ADCOF and ADCGN with an external
system components, the user may need to execute a system calibration to remove external endpoint errors and achieve these specifications (see the ADC Circuit Overview
section).
The input signal can be centered on any dc common-mode voltage (V
V
conditions.
DAC linearity is calculated using a reduced code range of 100 to 3995.
DAC gain error is calculated using a reduced code range of 100 to internal 2.5 V V
3.6 V supply, and sleep mode with 3.6 V supply.
Die temperature.
Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
Retention lifetime equivalent at junction temperature (T
Test carried out with a maximum of eight I/Os set to a low output level.
Power supply current consumption is measured in normal, pause, and sleep modes under the following conditions: normal mode with 3.6 V supply, pause mode with
IOV
REF
HBM Passed Up To
FCIDM Passed Up To
calibration and trimming are performed with core operating in normal mode (CD = 0), ADC on, and all DACs on. V
DD
power supply current decreases typically by 2 mA during a Flash/EE erase cycle.
Min
J
) = 85°C as per JEDEC Standard 22 Method A117. Retention lifetime derates with junction temperature.
Typ
CM
) as long as this value is within the ADC voltage input range specified.
Rev. 0 | Page 8 of 96
Max
4
0.5
REF
AD845
.
op amp as an input buffer stage, as shown in Figure 23. Based on external ADC
Unit
kV
kV
Test Conditions/Comments
2.5 V reference, T
REF
accuracy may vary under other operating
A
= 25°C

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