2MBI200U4B-120 FUJI, 2MBI200U4B-120 Datasheet

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2MBI200U4B-120

Manufacturer Part Number
2MBI200U4B-120
Description
IGBT MODULE
Manufacturer
FUJI
Datasheet

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www.DataSheet4U.com
Feb. 09 ’05
Feb. 09 ’05
S.Miyashita
T.Miyasaka
K.Yamada
Device Name
Type Name
Spec. No.
SPECIFICATION
Y.Seki
:
:
:
2MBI200U4B-120
IGBT MODULE
MS5F 6032
MS5F6032
H04-004-07b
1
13

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2MBI200U4B-120 Summary of contents

Page 1

... Feb. 09 ’05 Feb. 09 ’05 SPECIFICATION IGBT MODULE Device Name : 2MBI200U4B-120 Type Name : MS5F 6032 Spec. No. : S.Miyashita Y.Seki T.Miyasaka K.Yamada 1 MS5F6032 13 H04-004-07b ...

Page 2

Classi- Date Ind. fication Feb.-09 -’05 Enactment Applied Content Drawn date Issued date MS5F6032 Checked Checked Approved T.Miyasaka K.Yamada Y.Seki 2 13 H04-004-06b ...

Page 3

... Outline Drawing ( Unit : Equivalent circuit 2MBI200U4B-120 MS5F6032 3 13 H04-004-03a ...

Page 4

Absolute Maximum Ratings ( at Tc= 25 Items Collector-Emitter voltage Gate-Emitter voltage Collector current Collector Power Dissipation Junction temperature Storage temperature Isolation between terminal and copper base (*1) voltage Screw Mounting (*2) Torque Terminals (*2) (*1) All terminals should ...

Page 5

... Indication on module Logo of production 2MBI200U4B-120 Lot.No. 7. Applicable category This specification is applied to IGBT-Module named 2MBI200U4B-120. 8. Storage and transportation notes • The module should be stored at a standard temperature Store modules in a place with few temperature changes in order to avoid condensation on the • ...

Page 6

Reliability test results Test cate- Test items gories 1 Terminal Strength Pull force (Pull test) Test time 2 Mounting Strength Screw torque Test time 3 Vibration Range of frequency : 10 ~ 500Hz Sweeping time Acceleration Sweeping direction : ...

Page 7

Test cate- Test items gories 1 High temperature Reverse Bias Test temp. Bias Voltage Bias Method Test duration 2 High temperature Bias (for gate) Test temp. Bias Voltage Bias Method Test duration 3 Temperature Humidity Bias Test temp. Relative humidity ...

Page 8

Reliability Test Results Test cate- Test items gorie s 1 Terminal Strength (Pull test) 2 Mounting Strength 3 Vibration 4 Shock 1 High Temperature Storage 2 Low Temperature Storage 3 Temperature Humidity Storage 4 Unsaturated Pressurized Vapor 5 Temperature Cycle ...

Page 9

Collector current vs. Collector-Emitter voltage (typ.) o Tj= chip 500 VGE=20V 15V 12V 400 300 200 100 Collector-Emitter voltage : VCE [ V ] Collector current vs. Collector-Emitter voltage (typ.) VGE=15V / chip ...

Page 10

Switching time vs. Collector current (typ.) Vcc=600V, VGE=±15V, RG=3.0Ω, Tj=25 10000 1000 toff ton 100 10 0 100 200 300 Collector current : Switching time vs. Gate resistance (typ.) Vcc=600V, Ic=200A, VGE=±15V, Tj=25 10000 ton 1000 ...

Page 11

Forward current vs. Forward on voltage (typ.) chip 500 400 o Tj=25 C Tj=125 300 200 100 Forward on voltage : Transient thermal resistance (max.) 1.000 0.100 0.010 0.001 0.001 0.010 0.100 ...

Page 12

This product shall be used within its absolute maximum rating (voltage, current, and temperature). This product may be broken in case of using beyond the ratings. 製品の絶対最大定格(電圧,電流,温度等)の範囲内で御使用下さい。絶対最大定格を超えて使用すると、素子が破壊する 場合があります。 - Connect adequate fuse or protector of circuit between three-phase line and ...

Page 13

... The application examples described in this specification only explain typical ones that used the Fuji Electric Device Technology products. This specification never ensure to enforce the industrial property and other rights, nor license the enforcement rights. 本 ...

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