ad1315kz Analog Devices, Inc., ad1315kz Datasheet - Page 7

• Manufacturer Part Number: ad1315kz
• Description: High Speed Active Load With Inhibit Mode
• Manufacturer: Analog Devices, Inc.

APPLICATIONS
The AD1315 has been optimized to function as an active load
in an ATE test system. Figure 14 shows a block diagram illus-
trating the electronics behind a single pin of a high speed digital
functional test system with the ability to test I/O pins on logic
devices. The AD1315 active load, AD1321 or AD1324 pin
driver, AD1317 high speed dual comparator and the AD664
quad 12-bit voltage DAC would comprise the pin electronic
portion of the test system. Such a system could operate at
100 MHz with the AD1321 (200 MHz with the AD1324) in a
data mode or 50 MHz (100 MHz) in the I/O mode.
The V
With DUT output voltage above V
rent (I
REV. A
COM
OH
). With DUT output voltage below V
input sets the commutation voltage of the active load.
COM
Figure 14. High Speed Digital Test System Block Diagram
, the load will sink cur-
Figure 15. Suggested I
COM
, the load will
OHRTN
–7–
source current (I
must be able to sink or source 50 mA, therefore a standard op
amp will not suffice. An op amp with an external complemen-
tary output stage or a high power op amp such as the AD842
will work well here. A typical application is shown in Figure 15.
LAYOUT CONSIDERATIONS
I
–2 V and +7 V. These return points must be able to source or
sink 50 mA, since the I
diverted here in the inhibit mode. The RTNs may be connected
to a suitable GND. However, to keep transient ground currents
to a minimum, they are typically tied to the V
voltage point.
OHRTN
, I
OLRTN
and I
, V
COM
OLRTN
Hookup
OL
). Like the I
may be connected to any potential between
OH
and I
OH
OL
and I
programmed currents are
OL
return lines, the V
COM
AD1315
programming
COM