saa4996h NXP Semiconductors, saa4996h Datasheet - Page 44
saa4996h
Manufacturer Part Number
saa4996h
Description
Motion Adaptive Colour Plus And Control Ic Macpacic For Palplus
Manufacturer
NXP Semiconductors
Datasheet
1.SAA4996H.pdf
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Philips Semiconductors
Table 23 Control6
8
8.1
Boundary Scan Test (BST) is supported. See boundary scan specification: “IEEE Standard 1149.1 - 1990, IEEE standard
test access port and boundary scan architecture”.
8.1.1
The PALplus ICs MACPACIC and VERIC are equipped with BST identification registers. The identification codes and
their meaning are shown in Tables 24 and 25.
Table 24 Identification codes
Table 25 Code parts
1996 Oct 28
MACPACIC
VERIC
ADDRESS
Motion Adaptive Colour Plus And Control
IC (MACPACIC) for PALplus
(HEX)
TEST
68
IC
Boundary scan test
I
DENTIFICATION CODES
31 to 28
27 to 12
11 to 1
BITS
0
R/W
VERSION
W
3322
1098
0001
0001
4 to 0
BIT
7
6
5
EnPreEvFld 0: EVEN_FIELD signal defined internally
PreEvFld
Interlace
NAME
76543 21098 76543 2
01101 00001 00011 0
10110 00101 10010 0
22222 22211 11111 1
X
version number
COMPONENT
manufacturer
component
NAME
fixed
0: incoming video signal is defined as ‘non interlaced’
1: incoming video signal is defined as ‘interlaced’
1: EVEN_FIELD signal defined by SNERT transmission: PreEvFld
0: incoming field is defined as ‘Odd’
1: incoming field is defined as ‘Even’
no function
44
MANUFACTURER
11000000000
10987654321
00000010101
00000010101
start with 1 and increment every redesign
FUNCTION
first 3 characters of name
JEDEC code for PHILIPS
DESCRIPTION
FIXED
1
0
0
1
1
Preliminary specification
IDENTIFICATION
SAA4996H
1B16402B
1684602B
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