74HCT132N,652 NXP Semiconductors, 74HCT132N,652 Datasheet - Page 16
![IC TRIGGER NAND QUAD 2IN 14DIP](/photos/6/57/65747/568-14-dip_sot27-1_sml.jpg)
74HCT132N,652
Manufacturer Part Number
74HCT132N,652
Description
IC TRIGGER NAND QUAD 2IN 14DIP
Manufacturer
NXP Semiconductors
Series
74HCTr
Datasheets
1.74HCT4046ADB112.pdf
(19 pages)
2.74HCT4046ADB112.pdf
(23 pages)
3.74HC132N652.pdf
(8 pages)
Specifications of 74HCT132N,652
Number Of Circuits
4
Package / Case
14-DIP (0.300", 7.62mm)
Logic Type
NAND Gate - Schmitt Trigger
Number Of Inputs
2
Current - Output High, Low
5.2mA, 5.2mA
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Through Hole
Product
NAND
Logic Family
74HCT
High Level Output Current
- 4 mA
Low Level Output Current
4 mA
Propagation Delay Time
17 ns
Supply Voltage (max)
5.5 V
Supply Voltage (min)
4.5 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
Logical Function
NAND
Number Of Elements
4
Operating Supply Voltage (typ)
5V
Operating Temp Range
-40C to 125C
Package Type
PDIP
Number Of Outputs
1
Technology
CMOS
Mounting
Through Hole
Pin Count
14
Operating Temperature Classification
Automotive
Quiescent Current
2uA
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
4.5V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-1511-5
74HCT132N
933669150652
74HCT132N
933669150652
Philips Semiconductors
HCMOS family characteristics
FAMILY SPECIFICATIONS
AC CHARACTERISTICS
The “AC CHARACTERISTICS” table lists the guaranteed
limits when a device is tested under the conditions given in
the AC Test Circuits and Waveforms section.
TEST CIRCUITS
Good high-frequency wiring practices should be used in
test circuits. Capacitor leads should be as short as
possible to minimize ripples on the output waveform
transitions and undershoot. Generous ground metal
(preferably a ground-plane) should be used for the same
reasons. A V
decoupling capacitor should be provided
CC
at the test socket, also with short leads. Input signals
should have rise and fall times of 6 ns, a signal swing of
0 V to V
for 74HC and 0 V to 3 V for 74HCT; a 1.0 MHz
CC
square wave is recommended for most propagation delay
tests. The repetition rate must be increased for testing
f
. Two pulse generators are usually required for testing
max
such parameters as set-up time, hold time and removal
time. f
is also tested with 6 ns input rise and fall times,
max
with a 50% duty factor, but for typical f
as high as
max
60 MHz, there are no constraints on rise and fall times.
March 1988
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