la79b-1-4g-1-pf Ligitek Electronics Co., Ltd., la79b-1-4g-1-pf Datasheet - Page 6
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la79b-1-4g-1-pf
Manufacturer Part Number
la79b-1-4g-1-pf
Description
Led Array
Manufacturer
Ligitek Electronics Co., Ltd.
Datasheet
1.LA79B-1-4G-1-PF.pdf
(6 pages)
PART NO.
Reliability Test:
Thermal Shock Test
Operating Life Test
High Temperature
High Humidity Test
High Temperature
Solder Resistance
Low Temperature
Solderability Test
Storage Test
Storage Test
Test Item
Test
LA79B-1/4G-1-PF
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
1.Ta=105
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=-40
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=65
2.RH=90 %~95%
3.t=240hrs
1.Ta=105
2.total 10 cycles
1.T.Sol=260
2.Dwell time= 10
1.T.Sol=230
2.Dwell time=5
(10min) (10min)
Test Condition
℃±
℃±
℃±
℃±
±
5
2hrs
℃±
℃±
5
5
℃
5
℃
℃
℃
±
5
5
1sec
±
&-40
℃
℃
1sec.
℃±
5
℃
The purpose of this is the resistance of
the device which is laid under ondition
of high temperature for hours.
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
The purpose of this test is the resistance
of the device under tropical for hous.
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
This test intended to see soldering well
performed or not.
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Description
MIL-STD-202: 107D
MIL-STD-202: 210A
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-750: 2031
MIL-STD-750: 1026
MIL-STD-883: 1005
MIL-STD-202:103B
MIL-STD-883:1008
JIS C 7021: B-10
JIS C 7021: B-12
JIS C 7021: B-11
JIS C 7021: A-2
JIS C 7021: A-1
JIS C 7021: B-1
Reference
Standard
Page
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