L9333DIE1 STMICROELECTRONICS [STMicroelectronics], L9333DIE1 Datasheet - Page 9

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L9333DIE1

Manufacturer Part Number
L9333DIE1
Description
QUAD LOW SIDE DRIVER
Manufacturer
STMICROELECTRONICS [STMicroelectronics]
Datasheet
EMC SPECIFICATION
EMS (electromagnetic susceptibility)
Measurement setup:
DUT mounted on a specific application board is driven in a typical application circuit (see below). Two devices
are stimulated by a generator to read and write bus signals. They will be monitored externally to ensure proper
function.
Measurement method:
a)
b)
c)
Failure criteria:
Failure monitoring is done by envelope measurement of the logic signals with a LeCroy oscilloscope with ac-
ceptance levels of 20% in amplitude and 2% time.
Limits:
The device is measured within the described setup and limits without fail function.
The Electromagnetic Susceptivity is not tested in production.
a) Field strength under stripline of > 250V/m in the frequency range 1 - 400MHz modulation:AM 1kHz 80%.
b) Field strength in TEM-cell of > 500V/m in the frequency range 1 - 400MHz modulation:
c) RF-currents with BCI of > 100mA in the frequency range 1 - 400MHz modulation:
Measured Circuit
The EMS of the device was verified in the below described setup.
The two bus lines are transferred 2m under a terminated stripline. That's where they were exposed to the
RF-field. Stripline setup and measurement method is described in DIN 40839-4 or ISO 11452-5.
DUT mounted on the same application board is exposed to RF through the tophole of a TEM-cell. Mea-
surement method according SAE J1752.
The two bus lines are transferred into a BCI current injection probe. Setup and measurement method is
described in ISO 11452-4.
AM 1kHz 80%.
AM 1kHz 80%.
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